Harris Rusty (37 results)

- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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- Softcover
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Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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- Softcover
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrelandKennys Bookshop and Art Galleries Ltd.
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- Softcover
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Condition: New. pp. 194.

- Softcover
Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
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- Softcover
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Seller: PBShop.store UK, Fairford, GLOS, United KingdomPBShop.store UK
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- Softcover
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Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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Condition: New. Print on Demand pp. 168 2:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on Creme w/Gloss Lam.

- Softcover
- Print on Demand
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condition: New. Print on Demand pp. 168.

- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - To address the increasing demands of device scaling, new materials are being introduced into conventional Si CMOS processing at an unprecedented rate. Presentations collected here focus on understanding, from a chemistry and materials perspective,…the mechanism of interface formation and defects at interfaces, for both conventional Si and alternative channel (Ge or III-V) systems. Several papers address reliability concerns for high-k/metal gate (basic physical models, charge trapping, etc.), while others cover characterization of the thin films and interfaces which comprise the gate stack. Topics include: advanced Si-based gate stacks; and alternate channel materials.

Cmos Gate-stack Scaling Materials, Interfaces and Reliability Implications : Symposium Held April 14-16, 2009, San Francisco, California, U.s.a.
Butterbaugh, J. (EDT); Demkov, a (EDT); Harris, R. (EDT); Rachmady, W. (EDT); Taylor, B. (EDT)
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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- Hardcover
Seller: California Books, Miami, FL, U.S.A.California Books
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Gardens of Georgia [Savannah and the Coast --- Coastal Georgia -- The Piedmont plateau -- South Georgia -- Atlanta and North Georgia -- Index of Gardens -- Sources for quoted material -- Bibliography
Mitchell, William R. ; Moore, Richard, 1955- , Deloye Burrell,Tom Woodham, James Valentine, Paul C. Beswick, Michael Portman, photography.; editors, VanJones Martin, Lisa Lytton-Smith, Kathleen Bergen Durham, Rusty Smith; contributors, Deen Day Smith, Jean Hogan, Val Sheridan, Mary Sheridan, Bryan Haltermann, Harriet Haltermann, Clason Kyle, Ben Grace, Robert Tucker, Dan Franklin, Edith henderson, David Byers, Laura Ellis, Clermont Lee, Ed Daughert, Jim Gibbs, Ryan Gainey, Doug Dorough, Patricia Ray, Robert J. Hill, Emily Harris, Louise Allen, Henry Howell, Louisa McIntosh, Martha Bateman, Ken Thomas, Jane Boyd, Julia Orme Martin, Carl Cofer, Barbara Stegall, Roy Mann, Eugene Cline, Margarita Cline, Sam W. Mangham, BG McElwee, P Fugger
Language: English
Published by Atlanta : Peachtree Publishers : Garden Club of Georgia, c1989., 1989
- Hardcover
- First Edition
Seller: Joseph Valles - Books, Stockbridge, GA, U.S.A.Joseph Valles - Books
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Hardcover. Condition: Fine. Dust Jacket Condition: Fine. 1st Edition. [1st edition, 1st printing; trade edition ] ; ix, 214 p. : ill. (chiefly col.) ; 31 cm. ; ISBN 9780934601764, 9780934601771, 0934601763, 0934601771 ; OCLC 20012286 ; LCCN 89016100 ; LC SB466.U65 G46 1989 ; Dewey 712/.09758 ; sand-colored cloth in color photogr…aphic dustjacket ; Contents: Savannah and the Coast --- Coastal Georgia -- The Piedmont plateau -- South Georgia -- Atlanta and North Georgia -- Index of Gardens -- Sources for quoted material -- Bibliography ; Graced with one of the longest growing seasons in North America, Georgia has a rich and interesting tradition of gardens and gardening. That tradition is vividly portrayed in Gardens of Georgia, commissioned by the Garden Club of Georgia, Inc., to commemorate its sixtieth anniversary and to celebrate the heritage and beauty of Georgia's gardens.As noted by Georgia founder James Oglethorpe in 1732, Georgia has a happy climate. From the broad-shouldered mountains of the Blue Ridge, through the red clay of the rolling piedmont, across the sprawling piney coastal plain, and on to the subtropical islands on the Atlantic, Georgia is blessed with four regions of gardening opportunities, distinctly defined by differences in elevation, climate, soil, and natural vegetation.Writer William Mitchell and photographer Richard Moore have portrayed the wonders of gardens historic and contemporary, public and private, and urban, suburban, and rural from each of these regions. Whether illustrating overall gardenscapes or capturing intimate vignettes and individual blossoms, Richard Moore's photographs have a depth of color and clarity of detail that immerse the reader into a world of delightful splendor. The text by Willaim Mitchell not only describes the settings as they are today, but also spins a rich background of history in the context of the botanical Eden observed by early explorers.The richest legacy of each generation is to preserve and protect an always vulnerable natural environment and help nature bring forth its green and glowing cycles of rebirth. Gardens of Georgia celebrates that legacy, sharing the ongoing dream of paradise--a new Eden--whether it is in a grand formal garden from an earlier era or a small plot of perennials in a Georgia yard. ; FINE/FINE. Book.

- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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- Softcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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Condition: New. PRINT ON DEMAND pp. 168.

Cmos Gate-stack Scaling Materials, Interfaces and Reliability Implications : Symposium Held April 14-16, 2009, San Francisco, California, U.s.a.
Butterbaugh, J. (EDT); Demkov, a (EDT); Harris, R. (EDT); Rachmady, W. (EDT); Taylor, B. (EDT)
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Cmos Gate-stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155
. Ed(s): Demkov, Alexander A. (Freescale Semiconductor Inc., Austin, Texas); Taylor, Bill; Harris, H. Rusty; Butterbaugh, Jeffery W.; Rachmady, Willy
- Hardcover
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrelandKennys Bookshop and Art Galleries Ltd.
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Condition: New. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Editor(s): Demkov, Alexander A. (Freescale Semiconductor Inc., Austin, Texas); Taylor, Bill; Harris, H. Rusty; Butterbaugh, Jeffery W.; Rachmady, Willy. Series: MRS Proceedings. Num Pages: 19…4 pages, Illustrations. BIC Classification: TGM. Category: (U) Tertiary Education (US: College). Dimension: 228 x 152 x 13. Weight in Grams: 430. . 2009. Hardback. . . . .

- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condition: New. pp. viii + 179.

Cmos Gate-stack Scaling Materials, Interfaces and Reliability Implications : Symposium Held April 14-16, 2009, San Francisco, California, U.s.a.
Butterbaugh, J. (EDT); Demkov, a (EDT); Harris, R. (EDT); Rachmady, W. (EDT); Taylor, B. (EDT)
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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- Hardcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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£ 138.61
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Hardcover. Condition: Brand New. 194 pages. 9.13x6.30x0.79 inches. In Stock.

- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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Cmos Gate-stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155
. Ed(s): Demkov, Alexander A. (Freescale Semiconductor Inc., Austin, Texas); Taylor, Bill; Harris, H. Rusty; Butterbaugh, Jeffery W.; Rachmady, Willy
- Hardcover
Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
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£ 148.44
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Condition: New. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Editor(s): Demkov, Alexander A. (Freescale Semiconductor Inc., Austin, Texas); Taylor, Bill; Harris, H. Rusty; Butterbaugh, Jeffery W.; Rachmady, Willy. Series: MRS Proceedings. Num Pages: 19…4 pages, Illustrations. BIC Classification: TGM. Category: (U) Tertiary Education (US: College). Dimension: 228 x 152 x 13. Weight in Grams: 430. . 2009. Hardback. . . . . Books ship from the US and Ireland.

Cmos Gate-stack Scaling Materials, Interfaces and Reliability Implications : Symposium Held April 14-16, 2009, San Francisco, California, U.s.a.
Butterbaugh, J. (EDT); Demkov, a (EDT); Harris, R. (EDT); Rachmady, W. (EDT); Taylor, B. (EDT)
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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£ 138.34
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - To address the increasing demands of device scaling, new materials are being introduced into conventional Si CMOS processing at an unprecedented rate. Presentations collected here focus on understanding, from a chemistry and materials perspective, the mec…hanism of interface formation and defects at interfaces, for both conventional Si and alternative channel (Ge or III-V) systems. Several papers address reliability concerns for high-k/metal gate (basic physical models, charge trapping, etc.), while others cover characterization of the thin films and interfaces which comprise the gate stack. Topics include: advanced Si-based gate stacks; and alternate channel materials.

- Softcover
- Print on Demand
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Paperback. Condition: Brand New. 1st edition. 194 pages. 9.02x5.98x0.39 inches. In Stock. This item is printed on demand.

- Softcover
- Print on Demand
Seller: THE SAINT BOOKSTORE, Southport, United KingdomTHE SAINT BOOKSTORE
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Paperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.

- Softcover
- Print on Demand
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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Condition: New. Print on Demand pp. 194.

Cmos Gate-Stack Scaling Materials, Interfaces and Reliability Implications
Rachmady Willy Butterbaugh Jeffery W. Harris H. Rusty Taylor Bill Demkov Alexander A.
- Softcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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Condition: New. PRINT ON DEMAND pp. 194.

- Softcover
- Print on Demand
Seller: CitiRetail, Stevenage, United KingdomCitiRetail
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Paperback. Condition: new. Paperback. To address the increasing demands of device scaling, new materials are being introduced into conventional Si CMOS processing at an unprecedented rate. Presentations collected here focus on understanding, from a chemistry and materials perspective, the mechanism of interface formation and def…ects at interfaces, for both conventional Si and alternative channel (Ge or III-V) systems. Several papers address reliability concerns for high-k/metal gate (basic physical models, charge trapping, etc.), while others cover characterization of the thin films and interfaces which comprise the gate stack. Topics include: advanced Si-based gate stacks; and alternate channel materials. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.