Cmos Gate-stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

. Ed(s): Demkov, Alexander A. (Freescale Semiconductor Inc., Austin, Texas); Taylor, Bill; Harris, H. Rusty; Butterbaugh, Jeffery W.; Rachmady, Willy

ISBN 10: 1605111287 ISBN 13: 9781605111285
Published by Materials Research Society, 2009
Language: English
Condition: New Hardcover

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