CMOS Gate-Stack Scaling ― Materials, Interfaces and Reliability Implications: Volume 1155: Symposium Held April 14-16, 2009, San Francisco, California, U.s.a. (MRS Proceedings) - Hardcover

 
9781605111285: CMOS Gate-Stack Scaling ― Materials, Interfaces and Reliability Implications: Volume 1155: Symposium Held April 14-16, 2009, San Francisco, California, U.s.a. (MRS Proceedings)

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

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9781107408326: Cmos GateStack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)

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ISBN 10:  1107408326 ISBN 13:  9781107408326
Publisher: Cambridge University Press, 2014
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