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Cmos GateStack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings) - Softcover
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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
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CMOS Gate-Stack Scaling ? Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
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Cambridge University Press, 2014
ISBN 10: 1107408326
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CMOS Gate-Stack Scaling â" Materials, Interfaces and Reliability Implications: Volume 1155
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Cambridge University Press, 2014
ISBN 10: 1107408326
ISBN 13: 9781107408326
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CMOS Gate-Stack Scaling ? Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Published by
Cambridge University Press, 2014
ISBN 10: 1107408326
ISBN 13: 9781107408326
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Softcover
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Cmos GateStack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
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Cambridge University Press 2014-06-05, 2014
ISBN 10: 1107408326
ISBN 13: 9781107408326
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Cmos GateStack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Published by
Cambridge University Press, 2014
ISBN 10: 1107408326
ISBN 13: 9781107408326
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Softcover
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CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155
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ISBN 10: 1107408326
ISBN 13: 9781107408326
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Cmos Gate-Stack Scaling Materials, Interfaces and Reliability Implications
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ISBN 10: 1107408326
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Cmos Gate-Stack Scaling Materials, Interfaces and Reliability Implications
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ISBN 10: 1107408326
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Cmos GateStack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Published by
Cambridge University Press, 2014
ISBN 10: 1107408326
ISBN 13: 9781107408326
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Softcover
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Cmos Gate-Stack Scaling Materials, Interfaces and Reliability Implications
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Cambridge University Press, 2014
ISBN 10: 1107408326
ISBN 13: 9781107408326
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