Cmos Gate-stack Scaling Materials, Interfaces and Reliability Implications : Symposium Held April 14-16, 2009, San Francisco, California, U.s.a.

Butterbaugh, J. (EDT); Demkov, a (EDT); Harris, R. (EDT); Rachmady, W. (EDT); Taylor, B. (EDT)

ISBN 10: 1605111287 ISBN 13: 9781605111285
Published by Cambridge University Press, 2009
Language: English
Condition: Used - As new Hardcover

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