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CMOS Gate-Stack Scaling ? Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
Condition: New.
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Integration of functional oxides with semiconductors.
Book 13 of 68: SpringerBriefs in MaterialsLanguage: English
Published by New York/Heidelberg/Dordrecht, Springer., 2014
ISBN 10: 1461493196 ISBN 13: 9781461493198
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 4 out of 5 stars
24 cm. X, 278 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
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Variational principles in the theory of collisions.
Language: English
Published by Oxford, Pergamon Press, 1963
Hardcover. Ex-library with stamp and library-signature. GOOD condition, some traces of use. Ancien Exemplaire de bibliothèque avec signature et cachet. BON état, quelques traces d'usure. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. 81 DEM Sprache: Englisch Gewicht in Gramm: 550.
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CMOS Gate-Stack Scaling ? Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 29.69
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Cmos GateStack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Language: English
Published by Cambridge University Press 2014-06-05, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
£ 27.77
£ 15.49 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketPaperback. Condition: New.
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X/157 S./pp., Originalpappband (publisher's cardboard covers), Bibliotheksexemplar in sehr gutem Zustand / exlibrary in excellent condition (Stempel auf Titel / title stamped, Rückenschildchen / lettering pannel to the spine, Block sehr gut / contents fine, keine Unterstreichungen oder Anstreichungen / no underlining or remarks, nicht in Folie eingeschlagen / not wrapped up in foil), Sprache: englisch.
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Cmos GateStack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New.
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Cmos Gate-Stack Scaling Materials, Interfaces and Reliability Implications
Language: English
Published by Cambridge University Press CUP, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
Condition: New. pp. 194.
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Variational Principles in the Theory of Collisions
Language: English
Published by Macmillan Company, NY, 1963
Seller: Dorley House Books, Inc., Hagerstown, MD, U.S.A.
Seller rating 4 out of 5 stars
First Edition
Hardcover. Condition: Very Good. No Jacket. 1st. 1st American edition; navy c w/gilt titles; moderate shelf rubbing; ownr's name; 157 clean, unmarked pages.
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Cmos GateStack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
Condition: New.
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Zero-Range Potentials and Their Applications in Atomic Physics (Physics of Atoms and Molecules)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 50.43
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Zero-Range Potentials and Their Applications in Atomic Physics (Physics of Atoms and Molecules)
Language: English
Published by Springer US 1988-01-01, 1988
ISBN 10: 1468454536 ISBN 13: 9781468454536
Paperback. Condition: New.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Condition: New. pp. 300.
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Condition: New. pp. 296.
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Paperback. Condition: Brand New. reprint edition. 296 pages. 10.00x7.00x0.68 inches. In Stock.
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Condition: New. pp. 296.
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Condition: Used. pp. 290.
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Condition: Used. pp. 290.
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Condition: New. pp. 290 146 Illus. (113 Col.).
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CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications : Volume 1155
Language: English
Published by Cambridge University Press, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - To address the increasing demands of device scaling, new materials are being introduced into conventional Si CMOS processing at an unprecedented rate. Presentations collected here focus on understanding, from a chemistry and materials perspective, the mechanism of interface formation and defects at interfaces, for both conventional Si and alternative channel (Ge or III-V) systems. Several papers address reliability concerns for high-k/metal gate (basic physical models, charge trapping, etc.), while others cover characterization of the thin films and interfaces which comprise the gate stack. Topics include: advanced Si-based gate stacks; and alternate channel materials.
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Taschenbuch. Condition: Neu. Zero-Range Potentials and Their Applications in Atomic Physics | Yu. N. Demkov (u. a.) | Taschenbuch | Physics of Atoms and Molecules | 296 S. | Englisch | 2012 | Springer | EAN 9781468454536 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Cmos Gate-stack Scaling Materials, Interfaces and Reliability Implications : Symposium Held April 14-16, 2009, San Francisco, California, U.s.a.
Language: English
Published by Cambridge University Press, 2009
ISBN 10: 1605111287 ISBN 13: 9781605111285
Condition: New.
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CMOS Gate-Stack Scaling ? Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2009
ISBN 10: 1605111287 ISBN 13: 9781605111285
Condition: New.
-
CMOS Gate-Stack Scaling ? Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2009
ISBN 10: 1605111287 ISBN 13: 9781605111285
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 100.22
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Cmos Gate-stack Scaling Materials, Interfaces and Reliability Implications : Symposium Held April 14-16, 2009, San Francisco, California, U.s.a.
Language: English
Published by Cambridge University Press, 2009
ISBN 10: 1605111287 ISBN 13: 9781605111285
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 100.21
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Cmos Gate-stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155
Language: English
Published by Materials Research Society, 2009
ISBN 10: 1605111287 ISBN 13: 9781605111285
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Editor(s): Demkov, Alexander A. (Freescale Semiconductor Inc., Austin, Texas); Taylor, Bill; Harris, H. Rusty; Butterbaugh, Jeffery W.; Rachmady, Willy. Series: MRS Proceedings. Num Pages: 194 pages, Illustrations. BIC Classification: TGM. Category: (U) Tertiary Education (US: College). Dimension: 228 x 152 x 13. Weight in Grams: 430. . 2009. Hardback. . . . .
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International EditionCondition: New. Brand New ! Fast Delivery "International Edition " and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 4-6 Working days .and we do have flat rate for up to 2LB. Extra shipping charges will be requested This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
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Automated Decision-Making and Effective Remedies: The New Dynamics in the Protection of EU Fundamental Rights in the Area of Freedom, Security and Justice
Language: English
Published by Edward Elgar Publishing Ltd, 2023
ISBN 10: 1035306603 ISBN 13: 9781035306602
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. 2023. Hardback. . . . . .
