Cmos Gate-Stack Scaling Materials, Interfaces and Reliability Implications

Rachmady Willy Butterbaugh Jeffery W. Harris H. Rusty Taylor Bill Demkov Alexander A.

ISBN 10: 1107408326 ISBN 13: 9781107408326
Published by Cambridge University Press, 2014
Language: English
Condition: New Soft cover

Sold by Biblios, Frankfurt am main, HESSE, Germany

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