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CMOS Gate-Stack Scaling شاِ Materials, Interfaces and Reliability Implications: Symposium Held April 14-16, 2009, San Francisco, California, U.s.a.: 1155 (MRS Proceedings) - Hardcover
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Cmos Gate-stack Scaling Materials, Interfaces and Reliability Implications : Symposium Held April 14-16, 2009, San Francisco, California, U.s.a.
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Cambridge University Press, 2009
ISBN 10: 1605111287
ISBN 13: 9781605111285
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CMOS Gate-Stack Scaling ? Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Published by
Cambridge University Press, 2009
ISBN 10: 1605111287
ISBN 13: 9781605111285
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CMOS Gate-Stack Scaling ? Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Published by
Cambridge University Press, 2009
ISBN 10: 1605111287
ISBN 13: 9781605111285
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Cmos Gate-stack Scaling Materials, Interfaces and Reliability Implications : Symposium Held April 14-16, 2009, San Francisco, California, U.s.a.
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ISBN 10: 1605111287
ISBN 13: 9781605111285
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Cmos Gate-stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155
Published by
Materials Research Society, 2009
ISBN 10: 1605111287
ISBN 13: 9781605111285
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Condition: New. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Editor(s): Demkov, Alexander A. (Freescale Semiconductor Inc., Austin, Texas); Taylor, Bill; Harris, H. Rusty; Butterbaugh, Jeffery W.; Rachmady, Willy. Series: MRS Proceedings. Num Pages: 194 pages, Illustrations. BIC Classification: TGM. Category: (U) Tertiary Education (US: College). Dimension: 228 x 152 x 13. Weight in Grams: 430. . 2009. Hardback. . . . . Seller Inventory # V9781605111285
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CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155
Published by
Materials Research Society, 2009
ISBN 10: 1605111287
ISBN 13: 9781605111285
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Cmos Gate-stack Scaling Materials, Interfaces and Reliability Implications: Symposium Held April 14-16, 2009, San Francisco, California, U.s.a.: Vol 1155
Published by
Materials Research Society, 2009
ISBN 10: 1605111287
ISBN 13: 9781605111285
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Hardcover. Condition: Brand New. 194 pages. 9.13x6.30x0.79 inches. In Stock. Seller Inventory # x-1605111287
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Cmos Gate-Stack Scaling-- Materials, Interfaces and Reliability Implications
Published by
Materials Research Society, 2009
ISBN 10: 1605111287
ISBN 13: 9781605111285
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Cmos Gate-stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155
Published by
Materials Research Society, 2009
ISBN 10: 1605111287
ISBN 13: 9781605111285
New
Hardcover
Seller: Kennys Bookstore, Olney, MD, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Editor(s): Demkov, Alexander A. (Freescale Semiconductor Inc., Austin, Texas); Taylor, Bill; Harris, H. Rusty; Butterbaugh, Jeffery W.; Rachmady, Willy. Series: MRS Proceedings. Num Pages: 194 pages, Illustrations. BIC Classification: TGM. Category: (U) Tertiary Education (US: College). Dimension: 228 x 152 x 13. Weight in Grams: 430. . 2009. Hardback. . . . . Books ship from the US and Ireland. Seller Inventory # V9781605111285
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CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications
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Cambridge University Press, 2016
ISBN 10: 1605111287
ISBN 13: 9781605111285
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.KlappentextThe MRS Symposium Proceeding series is an internationally recognised reference suitable for research. Seller Inventory # 448148207
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