ISBN: 9780486450285 - A User's Guide to Ellipsometry (dover Civil and Mechanical Engineering) (23 results)
Language: English
Published by Dover Publications, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
Seller: Patrico Books, Apollo Beach, FL, U.S.A.Patrico Books
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paperback. Condition: Very Good. Ships Out Tomorrow.
Language: English
Published by Dover Publications, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
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Language: English
Published by Dover Publications, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
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Condition: New. Brand New! Not Overstocks or Low Quality Book Club Editions! Direct From the Publisher! We're not a giant, faceless warehouse organization! We're a small town bookstore that loves books and loves it's customers! Buy from Lakeside Books.
Language: English
Published by Dover Publications 7/7/2006, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
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Paperback or Softback. Condition: New. A User's Guide to Ellipsometry. Book.
Language: English
Published by Dover Publications Inc., US, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
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Paperback. Condition: New.
Language: English
Published by Dover Publications, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
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Language: English
Published by Dover Publications Inc., New York, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
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Paperback. Condition: new. Paperback. This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. Its 14 case studies illustrate concepts and reinforce applications of ellipsometry - particularly in relation to the semiconductor industry and to studies involving corrosion and oxide growth.A User's Guide to Ellipsometry will enable readers to move beyond limited turn-key applications of ellipsometers. In addition to its comprehensive discussions of the measurement of film thickness and optical constants in film, it also considers the trajectories of the ellipsometric parameters Del and Psi and how changes in materials affect parameters. This volume also addresses the use of polysilicon, a material commonly employed in the microelectronics industry, and the effects of substrate roughness. Three appendices provide helpful references. Text for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 1993 edition. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.…
Language: English
Published by Dover Publications Inc., US, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
Seller: Rarewaves.com USA, London, LONDO, United KingdomRarewaves.com USA
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Paperback. Condition: New.
Language: English
Published by Dover Publications, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
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Language: English
Published by Dover Publications Inc. 2009-01-01, 2009
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
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Paperback. Condition: New. Brand new book, sourced directly from publisher. Dispatch time is 7-8 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.
Language: English
Published by Dover Pubns, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
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Paperback. Condition: Brand New. 260 pages. 8.25x5.25x0.50 inches. In Stock.
Language: English
Published by Dover Publications, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
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Language: English
Published by Dover Publications, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
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Condition: As New. Unread book in perfect condition.
Language: English
Published by Dover Publications, Incorporated, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
Seller: Books Puddle, Woodside, NY, U.S.A.Books Puddle
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Condition: New. pp. xii + 260.
Language: English
Published by Dover Publications, Incorporated, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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Condition: New. pp. xii + 260 Illus.
Language: English
Published by Dover Publications Jul 2006, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Neuware - This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 14 case studies illustrate concepts and applications. Three appendices provide helpful references. 1993 edition.…
Language: English
Published by Dover Publications Inc., US, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
Seller: Rarewaves USA United, HEBRON, KY, U.S.A.Rarewaves USA United
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Paperback. Condition: New.
Language: English
Published by Dover Publications Inc., 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
Seller: moluna, Greven, Germanymoluna
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Condition: New. Inhaltsverzeichnisrnrn1. Theoretical Aspectsn2. Instrumentationn3. Using Optical Parameters to Determine Material Propertiesn4. Determining Optical Parameters for Inaccessible Substrates and Unknown Filmsn5. Extremely Thin Filmsn6. The Spe.
Language: English
Published by Dover Publications, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
Seller: BennettBooksLtd, Los Angeles, CA, U.S.A.BennettBooksLtd
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paperback. Condition: New. In shrink wrap. Looks like an interesting title.
Language: English
Published by Dover Publications Inc., US, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
Seller: Rarewaves.com UK, London, United KingdomRarewaves.com UK
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Paperback. Condition: New.
Language: English
Published by Dover Publications Inc., 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
- Print on Demand
Seller: THE SAINT BOOKSTORE, Southport, United KingdomTHE SAINT BOOKSTORE
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Paperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
Language: English
Published by Dover Publications Inc., New York, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
- Print on Demand
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Paperback. Condition: new. Paperback. This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. Its 14 case studies illustrate concepts and reinforce applications of ellipsometry - particularly in relation to the semiconductor industry and to studies involving corrosion and oxide growth.A User's Guide to Ellipsometry will enable readers to move beyond limited turn-key applications of ellipsometers. In addition to its comprehensive discussions of the measurement of film thickness and optical constants in film, it also considers the trajectories of the ellipsometric parameters Del and Psi and how changes in materials affect parameters. This volume also addresses the use of polysilicon, a material commonly employed in the microelectronics industry, and the effects of substrate roughness. Three appendices provide helpful references. Text for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 1993 edition. This item is printed on demand. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.…
Language: English
Published by Dover Publications Inc., New York, 2006
Series: Book 37 of 53 - Dover Civil and Mechanical Engineering
- Softcover
- Print on Demand
Seller: CitiRetail, Stevenage, United KingdomCitiRetail
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Paperback. Condition: new. Paperback. This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. Its 14 case studies illustrate concepts and reinforce applications of ellipsometry - particularly in relation to the semiconductor industry and to studies involving corrosion and oxide growth.A User's Guide to Ellipsometry will enable readers to move beyond limited turn-key applications of ellipsometers. In addition to its comprehensive discussions of the measurement of film thickness and optical constants in film, it also considers the trajectories of the ellipsometric parameters Del and Psi and how changes in materials affect parameters. This volume also addresses the use of polysilicon, a material commonly employed in the microelectronics industry, and the effects of substrate roughness. Three appendices provide helpful references. Text for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 1993 edition. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…
