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This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 14 case studies illustrate concepts and applications. Three appendices provide helpful references. 1993 edition.
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User's Guide to Ellipsometry
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A User's Guide to Ellipsometry
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Dover Publications Inc., 2006
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A User's Guide to Ellipsometry (Dover Civil and Mechanical Engineering)
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User's Guide to Ellipsometry
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A User's Guide to Ellipsometry (Paperback)
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Dover Publications Inc., New York, 2006
ISBN 10: 0486450287
ISBN 13: 9780486450285
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Paperback. Condition: new. Paperback. This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. Its 14 case studies illustrate concepts and reinforce applications of ellipsometry - particularly in relation to the semiconductor industry and to studies involving corrosion and oxide growth.A User's Guide to Ellipsometry will enable readers to move beyond limited turn-key applications of ellipsometers. In addition to its comprehensive discussions of the measurement of film thickness and optical constants in film, it also considers the trajectories of the ellipsometric parameters Del and Psi and how changes in materials affect parameters. This volume also addresses the use of polysilicon, a material commonly employed in the microelectronics industry, and the effects of substrate roughness. Three appendices provide helpful references. Text for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 1993 edition. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Seller Inventory # 9780486450285
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A User's Guide to Ellipsometry (Paperback or Softback)
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A User's Guide to Ellipsometry
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A User's Guide to Ellipsometry
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Taschenbuch. Condition: Neu. Neuware - Text for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 1993 edition. Seller Inventory # 9780486450285
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