Order Total (1 Item Items):
Shipping Destination:
Design Analysis Accelerated Tests by Luvalle Michael (14 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (14)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (11)
- As New, Fine or Near Fine (2)
- Very Good or Good (No further results match this refinement)
- Fair or Poor (No further results match this refinement)
- As Described (1)
Binding
- All Bindings
- Hardcover (14)
- Softcover (No further results match this refinement)
Collectible Attributes
- First Edition (1)
- Signed (No further results match this refinement)
- Dust Jacket (No further results match this refinement)
- Seller-Supplied Images (3)
- Not Print on Demand (13)
Language (1)
Free Shipping
Seller Location
Seller Rating
-
Design and Analysis of Accelerated Tests for Mission Critical Reliability.
Language: English
Published by Chapman and Hall/CRC., 2004
ISBN 10: 1584884711 ISBN 13: 9781584884712
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 4 out of 5 stars
First Edition
1st ed. 16 x 24 cm. 248 pages. HC Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
-
Design and Analysis of Accelerated Tests for Mission Critical Reliability
Language: English
Published by Chapman and Hall/CRC, 2004
ISBN 10: 1584884711 ISBN 13: 9781584884712
Condition: New.
-
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
-
Design and Analysis of Accelerated Tests for Mission Critical Reliability
Language: English
Published by Chapman and Hall/CRC, 2004
ISBN 10: 1584884711 ISBN 13: 9781584884712
Condition: As New. Unread book in perfect condition.
-
Design and Analysis of Accelerated Tests for Mission Critical Reliability
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
-
Design and Analysis of Accelerated Tests for Mission Critical Reliability
Language: English
Published by Chapman and Hall/CRC, 2004
ISBN 10: 1584884711 ISBN 13: 9781584884712
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
-
Hardcover. Condition: Brand New. 1st edition. 248 pages. 9.75x6.75x0.75 inches. In Stock.
-
Design and Analysis of Accelerated Tests for Mission Critical Reliability
Language: English
Published by Chapman and Hall/CRC, 2004
ISBN 10: 1584884711 ISBN 13: 9781584884712
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
-
Design and Analysis of Accelerated Tests for Mission Critical Reliability
Language: English
Published by Taylor & Francis Inc, 2004
ISBN 10: 1584884711 ISBN 13: 9781584884712
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
Hardback. Condition: New. New copy - Usually dispatched within 4 working days.
-
Design and Analysis of Accelerated Tests for Mission Critical Reliability
Language: English
Published by Taylor & Francis Group, 2004
ISBN 10: 1584884711 ISBN 13: 9781584884712
Condition: New. pp. 248.
-
Design and Analysis of Accelerated Tests for Mission Critical Reliability
Language: English
Published by Taylor & Francis Group, 2004
ISBN 10: 1584884711 ISBN 13: 9781584884712
Condition: New. pp. 248.
-
Condition: New. Michael J. LuValle, Bruce G. LeFevre, SirRaman KannanEarly approaches to accelerated testing were based on the assumption that there was a simple acceleration factor that would correspond to a linear scaling of time from the operating stress to the a.
-
Design and Analysis of Accelerated Tests for Mission Critical Reliability
Language: English
Published by Taylor & Francis Inc Apr 2004, 2004
ISBN 10: 1584884711 ISBN 13: 9781584884712
Buch. Condition: Neu. Neuware - This book presents innovative theory and methods for recognizing and handling the more complicated, cases often encountered in practice. The theory integrates a physical understanding of underlying phenomena and the statistical modeling of observation 'noise' to provide a single theoretical framework for accelerated testing. The treatment includes general approaches that can be used with various computational software packages and an explicit computing environment in S-PLUS, numerous worked examples, end-of-chapter exercises, and chapter appendices containing technical and theoretical details. Source code written by the authors is included and available for download from the CRC Web site.
-
Design and Analysis of Accelerated Tests for Mission Critical Reliability
Language: English
Published by Taylor & Francis Group, 2004
ISBN 10: 1584884711 ISBN 13: 9781584884712
Condition: New. pp. 248 Illus. This item is printed on demand.
