Design and Analysis of Accelerated Tests for Mission Critical Reliability

LuValle, Michael J.; Lefevree, Bruce G.; Kannan, Sri Raman; Lefevre, Bruce G.; Kannan, Sriraman

ISBN 10: 1584884711 ISBN 13: 9781584884712
Published by Chapman and Hall/CRC, 2004
Language: English
Condition: Used - As new Hardcover

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