Lefevree Bruce (4 results)
Design and Analysis of Accelerated Tests for Mission Critical Reliability
LuValle, Michael J.; Lefevree, Bruce G.; Kannan, Sri Raman; Lefevre, Bruce G.; Kannan, Sriraman
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
£ 72.81
£ 1.94 shippingShips within U.S.A.Quantity: 1 available
Condition: As New. Unread book in perfect condition.
Design and Analysis of Accelerated Tests for Mission Critical Reliability
LuValle, Michael J.; Lefevree, Bruce G.; Kannan, Sri Raman; Lefevre, Bruce G.; Kannan, Sriraman
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
£ 73.77
£ 1.94 shippingShips within U.S.A.Quantity: 1 available
Condition: New.
Design and Analysis of Accelerated Tests for Mission Critical Reliability
LuValle, Michael J.; Lefevree, Bruce G.; Kannan, Sri Raman; Lefevre, Bruce G.; Kannan, Sriraman
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
£ 61.86
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Condition: New.
Design and Analysis of Accelerated Tests for Mission Critical Reliability
LuValle, Michael J.; Lefevree, Bruce G.; Kannan, Sri Raman; Lefevre, Bruce G.; Kannan, Sriraman
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
£ 71.98
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Condition: As New. Unread book in perfect condition.
