Lefevre Bruce G (10 results)
- Hardcover
- First Edition
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, , GermanyUniversitätsbuchhandlung Herta Hold GmbH
Contact seller4-star sellerCondition: Used
£ 21.38
£ 25.94 shippingShips from Germany to U.S.A.Quantity: 1 available
1st ed. 16 x 24 cm. 248 pages. HC Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
Design and Analysis of Accelerated Tests for Mission Critical Reliability
LuValle, Michael J.; Lefevree, Bruce G.; Kannan, Sri Raman; Lefevre, Bruce G.; Kannan, Sriraman
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
£ 60.83
£ 1.97 shippingShips within U.S.A.Quantity: 1 available
Condition: New.
Design and Analysis of Accelerated Tests for Mission Critical Reliability
LuValle, Michael J.; Lefevree, Bruce G.; Kannan, Sri Raman; Lefevre, Bruce G.; Kannan, Sriraman
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
£ 63.38
£ 1.97 shippingShips within U.S.A.Quantity: 1 available
Condition: As New. Unread book in perfect condition.
Design and Analysis of Accelerated Tests for Mission Critical Reliability
LuValle, Michael J.; Lefevree, Bruce G.; Kannan, Sri Raman; Lefevre, Bruce G.; Kannan, Sriraman
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
£ 58.31
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Condition: New.
- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
£ 76.59
£ 2.97 shippingShips within U.S.A.Quantity: 4 available
Condition: New. pp. 248.
Design and Analysis of Accelerated Tests for Mission Critical Reliability
LuValle, Michael J.; Lefevree, Bruce G.; Kannan, Sri Raman; Lefevre, Bruce G.; Kannan, Sriraman
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
£ 63.26
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Condition: As New. Unread book in perfect condition.
Design and Analysis of Accelerated Tests for Mission Critical Reliability
LuValle, Michael J. (Author)/ LeFevre, Bruce G. (Author)/ Kannan, SirRaman (Author)
- Hardcover
Seller: Revaluation Books, Exeter, , United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
£ 68.85
£ 10.00 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Hardcover. Condition: Brand New. 1st edition. 248 pages. 9.75x6.75x0.75 inches. In Stock.
- Hardcover
Seller: moluna, Greven, , Germanymoluna
Contact seller5-star sellerCondition: New
£ 68.78
£ 42.37 shippingShips from Germany to U.S.A.Quantity: 1 available
Condition: New. Michael J. LuValle, Bruce G. LeFevre, SirRaman KannanEarly approaches to accelerated testing were based on the assumption that there was a simple acceleration factor that would correspond to a linear scaling of time from the operating stress to the a.
- Hardcover
- Print on Demand
Seller: Majestic Books, Hounslow, , United KingdomMajestic Books
Contact seller4-star sellerCondition: New
£ 68.99
£ 6.50 shippingShips from United Kingdom to U.S.A.Quantity: 3 available
Condition: New. pp. 248 Illus. This item is printed on demand.
- Hardcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
Contact seller4-star sellerCondition: New
£ 79.65
£ 8.60 shippingShips from Germany to U.S.A.Quantity: 4 available
Condition: New. PRINT ON DEMAND pp. 248.
