Design and Analysis of Accelerated Tests for Mission Critical Reliability

LuValle Michael J LeFevre Bruce G. LuValle Michael J. Kannan SirRaman Lu Valle Michael J. Le Fevre Bruce G. Kannan Sir Raman

ISBN 10: 1584884711 ISBN 13: 9781584884712
Published by Taylor & Francis Group, 2004
Language: English
Condition: New Hardcover

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