Design and Analysis of Accelerated Tests for Mission Critical Reliability

Michael J LuValle Bruce G. LeFevre Michael J. LuValle SirRaman Kannan Michael J. Lu Valle Bruce G. Le Fevre Sir Raman Kannan

ISBN 10: 1584884711 ISBN 13: 9781584884712
Published by Taylor & Francis Group, 2004
Language: English
Condition: New Hardcover

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