Stroud Charles E Charles E Stroud (44 results)
Language: English
Published by Pennsylvania Historical Association, University Park, 2012
- Softcover
- First Edition
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Add to basketSoft cover. Condition: Near Fine. First Edition. Near fine in original wrappers.
Language: English
Published by Springer, 2002
- Hardcover
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hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.
Language: English
Published by Springer, 2002
- Hardcover
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Condition: good. Book is considered to be in good or better condition. The actual cover image may not match the stock photo. Hard cover books may show signs of wear on the spine, cover or dust jacket. Paperback book may show signs of wear on spine or cover as well as having a slight bend, curve or creasing to it. Book should hav…e minimal to no writing inside and no highlighting. Pages should be free of tears or creasing. Stickers should not be present on cover or elsewhere, and any CD or DVD expected with the book is included. Book is not a former library copy.
- Hardcover
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- Hardcover
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Language: English
Published by Springer, 2002
- Hardcover
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- Hardcover
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- Hardcover
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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Condition: New. pp. xxxvi + 856 Illus.
- Hardcover
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Condition: New. pp. xxxvi + 856.
- Hardcover
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Condition: New. pp. xxxvi + 856.
- Hardcover
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Condition: As New. Unread book in perfect condition.
Language: English
Published by Springer, 2002
- Hardcover
Seller: AwesomeBooks, Wallingford, United KingdomAwesomeBooks
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£ 126.63
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hardcover. Condition: Very Good. A Designerâs Guide to Built-In Self-Test: 19 (Frontiers in Electronic Testing, 19) This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clea…rly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. .
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Condition: As New. Unread book in perfect condition.
Language: English
Published by Springer -, 2002
- Hardcover
Seller: Bahamut Media, Reading, United KingdomBahamut Media
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hardcover. Condition: Very Good. Shipped within 24 hours from our UK warehouse. Clean, undamaged book with no damage to pages and minimal wear to the cover. Spine still tight, in very good condition. Remember if you are not happy, you are covered by our 100% money back guarantee.
Language: English
Published by Springer, 2013
- Softcover
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Language: English
Published by Springer, 2002
- Hardcover
Seller: Basi6 International, Irving, TX, U.S.A.Basi6 International
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Language: English
Published by Springer, 2002
- Hardcover
Seller: BennettBooksLtd, Los Angeles, CA, U.S.A.BennettBooksLtd
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hardcover. Condition: New. In shrink wrap. Looks like an interesting title.
Language: English
Published by Kluwer Academic, 2002
- Hardcover
Seller: Anybook.com, Lincoln, United KingdomAnybook.com
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Condition: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:9781402070501.
Language: English
Published by Springer, 2013
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Condition: New. In.
Language: English
Published by Springer, 2002
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Condition: New. In.
More imagesLanguage: English
Published by Humana, 2013
- Softcover
Seller: preigu, Osnabrück, Germanypreigu
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Taschenbuch. Condition: Neu. A Designer's Guide to Built-In Self-Test | Charles E. Stroud | Taschenbuch | xx | Englisch | 2013 | Humana | EAN 9781475776263 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Language: English
Published by Kluwer Academic Publishers, 2002
- Hardcover
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrelandKennys Bookshop and Art Galleries Ltd.
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£ 226.33
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Condition: New. Written from a designer's perspective, this title describes the BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. It pays particular attention to system-level use of BIST in order to maximize benefits of BIST through reduced testing time and cost as w…ell as high diagnostic resolution. Series: Frontiers in Electronic Testing. Num Pages: 340 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 20. Weight in Grams: 1450. . 2002. Hardback. . . . .
Language: English
Published by Kluwer Academic Publishers, US, 2002
- Hardcover
Seller: Rarewaves.com USA, London, LONDO, United KingdomRarewaves.com USA
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£ 236.41
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Hardback. Condition: New. 2002 ed. A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book… is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.
Language: English
Published by Springer, 2013
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condition: New. pp. 344.
Language: English
Published by Springer, 2002
- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condition: New. pp. 344.
Language: English
Published by Springer US, Humana, 2013
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the cur…rent time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.
Language: English
Published by Springer US, Springer New York, 2002
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current ti…me, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.
Language: English
Published by Springer, 2013
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Paperback. Condition: Brand New. 340 pages. 9.30x6.20x0.80 inches. In Stock.
Language: English
Published by Springer, 2002
- Hardcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Hardcover. Condition: Brand New. 344 pages. 9.50x6.50x1.00 inches. In Stock.
Language: English
Published by Kluwer Academic Publishers, 2002
- Hardcover
Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
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£ 275.68
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Condition: New. Written from a designer's perspective, this title describes the BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. It pays particular attention to system-level use of BIST in order to maximize benefits of BIST through reduced testing time and cost as w…ell as high diagnostic resolution. Series: Frontiers in Electronic Testing. Num Pages: 340 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 20. Weight in Grams: 1450. . 2002. Hardback. . . . . Books ship from the US and Ireland.
