System-on-Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems on Silicon) - Hardcover

Laung-Terng Wang

Hardcover

ISBN 10: 012373973X ISBN 13: 9780123739735

Publisher: Morgan Kaufmann, 2007

Synopsis

System-on-Chip Test Architectures A guide to VLSI Testing and Design-for-Testability techniques that allows students, researchers, DFT practitioners, and VLSI designers to master System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. It also includes practical problems at the end of each chapter for students. Full description

About this title

Review:

The comprehensive guide to modern system-on-chip testing and design for testability from bestselling author L.-T Wang!

Synopsis:

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40 per cent of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs.It emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. It has the most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book.

It covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. It discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. It includes practical problems at the end of each chapter for students.

About this edition

• Publisher: Morgan Kaufmann
• Publication date: 2007
• ISBN 10: 012373973X
• ISBN 13: 9780123739735
• Binding: Hardcover
• Edition number: 1
• Number of pages: 896