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Condition: As New. Unread book in perfect condition.
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VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 45.68
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Condition: New. pp. 154.
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Condition: New. pp. 154.
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Spacer Engineered Finfet Architectures : High-performance Digital Circuit Applications
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Spacer Engineered Finfet Architectures : High-performance Digital Circuit Applications
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Condition: New. pp. 154.
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VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers (Communications in Computer and Information Science)
Book 495 of 578: Communications in Computer and Information ScienceSeller: Ria Christie Collections, Uxbridge, United Kingdom
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£ 86.64
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Condition: New.
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VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers (Communications in Computer and Information Science, 711)
Book 199 of 578: Communications in Computer and Information ScienceSeller: Ria Christie Collections, Uxbridge, United Kingdom
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£ 96.88
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VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers (Communications in Computer and Information Science, 1066)
Book 284 of 578: Communications in Computer and Information ScienceSeller: Ria Christie Collections, Uxbridge, United Kingdom
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£ 96.88
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VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4ż6, 2019, Revised Selected Papers
Book 284 of 578: Communications in Computer and Information ScienceLanguage: English
Published by Springer Nature Singapore, 2019
ISBN 10: 9813297662 ISBN 13: 9789813297661
Condition: Gut. Zustand: Gut | Seiten: 792 | Sprache: Englisch | Produktart: Bücher | This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
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VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4ż6, 2019, Revised Selected Papers
Book 284 of 578: Communications in Computer and Information ScienceLanguage: English
Published by Springer Nature Singapore, 2019
ISBN 10: 9813297662 ISBN 13: 9789813297661
Condition: Sehr gut. Zustand: Sehr gut | Seiten: 792 | Sprache: Englisch | Produktart: Bücher | This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
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Vlsi Design And Test : 26th Internationa
Book 495 of 578: Communications in Computer and Information ScienceSeller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New.
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Spacer Engineered FinFET Architectures : High-Performance Digital Circuit Applications
Language: English
Published by Taylor & Francis Ltd Jun 2020, 2020
ISBN 10: 0367573555 ISBN 13: 9780367573553
Taschenbuch. Condition: Neu. Neuware - This book focusses on the spacer engineering aspects of novel MOS-based device-circuit co-design in sub-20nm technology node, its process complexity, variability, and reliability issues. It comprehensively explores the FinFET/tri-gate architectures with their circuit/SRAM suitability and tolerance to random statistical variations.
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Vlsi Design And Test : 23rd Internationa
Book 284 of 578: Communications in Computer and Information ScienceSeller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New.
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Taschenbuch. Condition: Neu. VLSI Design and Test | 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers | Brajesh Kumar Kaushik (u. a.) | Taschenbuch | xxi | Englisch | 2017 | Springer | EAN 9789811074691 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Taschenbuch. Condition: Neu. VLSI Design and Test | 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers | Ambika Prasad Shah (u. a.) | Taschenbuch | xviii | Englisch | 2022 | Springer | EAN 9783031215131 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Paperback. Condition: Brand New. 614 pages. 9.25x6.10x1.42 inches. In Stock.
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Taschenbuch. Condition: Neu. VLSI Design and Test | 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers | Anirban Sengupta (u. a.) | Taschenbuch | xvi | Englisch | 2019 | Springer | EAN 9789813297661 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Vlsi Design and Test: 21st International Symposium, Vdat 2017, Roorkee, India, June 29-july 2, 2017, Revised Selected Papers
Book 199 of 578: Communications in Computer and Information ScienceLanguage: English
Published by Springer-Verlag New York Inc, 2018
ISBN 10: 9811074690 ISBN 13: 9789811074691
Paperback. Condition: Brand New. revised edition. 840 pages. 9.25x6.10x1.73 inches. In Stock.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
