Tudu Jaynarayan Editor (1 results)
Author:
VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, July 1719, 2022, Revised Selected Papers: 1687 (Communications in Computer and Information Science, 1687)
Shah, Ambika Prasad (Editor) / Dasgupta, Sudeb (Editor) / Darji, Anand (Editor) / Tudu, Jaynarayan (Editor)
Language: English
Published by Springer, 2022
Series: Book 495 of 578 - Communications in Computer and Information Science
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Paperback. Condition: Brand New. 614 pages. 9.25x6.10x1.42 inches. In Stock.
