Vlsi Design and Test: 21st International Symposium, Vdat 2017, Roorkee, India, June 29-july 2, 2017, Revised Selected Papers

Kaushik, Brajesh Kumar (Editor)/ Dasgupta, Sudeb (Editor)/ Singh, Virendra (Editor)

ISBN 10: 9811074690 / ISBN 13: 9789811074691

Published by Springer-Verlag New York Inc, 2018

About this Item

revised edition. 840 pages. 9.25x6.10x1.73 inches. In Stock.

Seller Inventory # x-9811074690

Bibliographic Details

• Title: Vlsi Design and Test: 21st International Symposium, Vdat 2017, Roorkee, India, June 29-july 2, 2017, Revised Selected Papers
• Publisher: Springer-Verlag New York Inc
• Publication Date: 2018
• Language: English
• ISBN 10: 9811074690
• ISBN 13: 9789811074691
• Binding: Paperback
• Condition: Brand New
• Weight: 1.28 kilograms

About this title

Synopsis

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.