VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers

Language: English

Published by Springer 2019-08, 2019

9813297662 / 9789813297661

Series: Book 284 of 578 - Communications in Computer and Information Science

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Title
VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
Author
Sengupta, Anirban
Publisher
Springer 2019-08
Publication year
2019
Condition
New
Binding
PF
Language
English
ISBN 10
9813297662
ISBN 13
9789813297661
Series
Book 284 of 578: Communications in Computer and Information Science

Chiron Media

Wallingford, United Kingdom

5-star seller

AbeBooks seller since August 2, 2010

Shipping rates from United Kingdom to U.S.A.

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