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Bowen Tanner Brian (29 results)
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Hardcover. Condition: Very Good. Gift inscription by Author to fly leaf. This book is in very good condition; no remainder marks. It does have some cover shelfwear. Inside pages are clean. ; 24.6 X 17.4 X 1.56 centimeters; 264 pages.
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Condition: As New. Unread book in perfect condition.
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Condition: New.
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Condition: New. pp. 264.
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High Resolution X-ray Diffractometry and Topography
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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High Resolution X-ray Diffractometry and Topography
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Condition: New. pp. 264.
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Condition: New. pp. 264.
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Paperback. Condition: Brand New. 264 pages. 9.69x6.85x0.70 inches. In Stock.
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Paperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Hardcover. Condition: New. In shrink wrap. Looks like an interesting title!
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X-Ray Metrology in Semiconductor Manufacturing
Language: English
Published by Taylor & Francis Group, 2006
ISBN 10: 0849339286 ISBN 13: 9780849339288
Condition: New. pp. 296 Index.
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Condition: New.
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High Resolution X-Ray Diffraction and Topography
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 207.08
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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Condition: New.
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X-Ray Metrology in Semiconductor Manufacturing
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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High Resolution X-Ray Diffractometry And Topography
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 235.13
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Condition: As New. Unread book in perfect condition.
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High Resolution X-Ray Diffraction and Topography
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 242.99
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: New. D. Keith Bowen, Brian K. TannerThe scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved us.
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Condition: As New. Unread book in perfect condition.
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X-Ray Metrology in Semiconductor Manufacturing
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Hardcover. Condition: Brand New. 1st edition. 296 pages. 9.50x6.25x0.75 inches. In Stock.
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Hardcover. Condition: Brand New. 1st edition. 252 pages. 10.25x7.00x0.75 inches. In Stock.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Bowen, D.K. Tanner, Brian K.The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ra.
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X-Ray Metrology in Semiconductor Manufacturing
Language: English
Published by Taylor & Francis Group, 2006
ISBN 10: 0849339286 ISBN 13: 9780849339288
Condition: New. Print on Demand pp. 296 Illus. This item is printed on demand.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Bowen, D.K. Tanner, Brian K.The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of .
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X-Ray Metrology in Semiconductor Manufacturing
Language: English
Published by Taylor & Francis Group, 2006
ISBN 10: 0849339286 ISBN 13: 9780849339288
Condition: New. PRINT ON DEMAND pp. 296.
