High Resolution X-Ray Diffractometry And Topography - Softcover

Bowen, D.K.; Tanner, Brian K.

 
9780367400637: High Resolution X-Ray Diffractometry And Topography
Softcover
ISBN 10: 0367400634 ISBN 13: 9780367400637
Publisher: CRC Press, 2019

Synopsis

The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.

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About the Author

Bowen, D.K.; Tanner, Brian K.

"About this title" may belong to another edition of this title.

Publisher
CRC Press
Publication date
2019
Language
English
ISBN 10 
0367400634
ISBN 13 
9780367400637
Binding
Paperback
Edition number
1
Number of pages
264

Other Popular Editions of the Same Title

9780850667585: High Resolution X-Ray Diffractometry And Topography

Featured Edition

ISBN 10:  0850667585 ISBN 13:  9780850667585
Publisher: CRC Press, 1998
Hardcover