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Tutorial: Test Generation for Vlsi Chips
Language: English
Published by IEEE Computer Society, 1988
ISBN 10: 081868786X ISBN 13: 9780818687860
Hardcover. Condition: Bon. Ancien livre de bibliothèque. Petite(s) trace(s) de pliure sur la couverture. Légères traces d'usure sur la couverture. Salissures sur la tranche. Couverture différente. Edition 1988. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisat ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Slightly creased cover. Slight signs of wear on the cover. Stains on the edge. Different cover. Edition 1988. Ammareal gives back up to 15% of this item's net price to charity organizations.
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Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Condition: good. Signs of wear and consistent use.
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Tutorial: Test Generation for Vlsi Chips
Language: English
Published by IEEE Computer Society Press,U.S., 1988
ISBN 10: 081868786X ISBN 13: 9780818687860
Seller: avelibro OHG, Dinkelscherben, Germany
Association Member: BOEV
Seller rating 5 out of 5 stars
4°, Gebundene Ausgabe. Condition: Sehr gut. 400 Seiten Ausgetragenes Bibliotheksexemplar, Einband leicht berieben, Papier in altersgemäßem sehr gutem Zustand. B02-03-01F Sprache: Englisch Gewicht in Gramm: 1305.
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Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
Seller: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Seller rating 4 out of 5 stars
Condition: acceptable. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear such as cover tears discoloration, staining, marks, scuffs, etc. All pages intact.
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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits: 17 (Frontiers in Electronic Testing, 17)
Book 9 of 40: Frontiers in Electronic TestingLanguage: English
Published by Kluwer Academic Publishers, USA, 2004
ISBN 10: 0792379918 ISBN 13: 9780792379911
Hardcover. Condition: Very Good. No Jacket. Slight knock to front and back. Previous owner's name and date on top corner of front page. Black and white illustrations. Clean copy - appears as new and unused.
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Hardcover. Condition: New. US SELLER SHIPS FAST FROM USA.
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Condition: New. pp. 204.
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Condition: good. May show signs of wear, highlighting, writing, and previous use. This item may be a former library book with typical markings. No guarantee on products that contain supplements Your satisfaction is 100% guaranteed. Twenty-five year bookseller with shipments to over fifty million happy customers.
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Paperback. Condition: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
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Condition: New. pp. 204 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
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Condition: New. pp. 204.
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Condition: New.
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hardcover. Condition: New. In shrink wrap. Looks like an interesting title!
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Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal Vlsi Circuits
Book 9 of 40: Frontiers in Electronic TestingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: good. May show signs of wear, highlighting, writing, and previous use. This item may be a former library book with typical markings. No guarantee on products that contain supplements Your satisfaction is 100% guaranteed. Twenty-five year bookseller with shipments to over fifty million happy customers.
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Unified Methods for VLSI Simulation and Test Generation:
Language: English
Published by Boston. Kluwer Academic, 1989
ISBN 10: 0792390253 ISBN 13: 9780792390251
Seller: avelibro OHG, Dinkelscherben, Germany
Association Member: BOEV
Seller rating 5 out of 5 stars
8° , Hardcover/Pappeinband. Condition: Sehr gut. XII, 148 Seiten. Mit Illustrationen. Ausgetragenes Bibliotheksexemplar mit Inventaraufkleber auf Rücken und Vorsatz. Leihkarte in Tasche am Nachsatz. In sehr gutem Zustand. DE-10-19e Sprache: Englisch Gewicht in Gramm: 435.
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Neural Models and Algorithms for Digital Testing
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Concurrent and Comparative Discrete Event Simulation
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.15
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Neural Models and Algorithms for Digital Testing (The Springer International Series in Engineering and Computer Science, 140)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.15
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Concurrent and Comparative Discrete Event Simulation
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.15
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Neural Models and Algorithms for Digital Testing (The Springer International Series in Engineering and Computer Science)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.15
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.15
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Condition: New.
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Concurrent and Comparative Discrete Event Simulation
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Tutorial: Test Generation for Vlsi Chips
Language: English
Published by IEEE Computer Society Press,U.S., 1988
ISBN 10: 081868786X ISBN 13: 9780818687860
Condition: Sehr gut. Zustand: Sehr gut | Seiten: 400 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
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Unified Methods for VLSI Simulation and Test Generation
Language: English
Published by Kluwer Academic Publishers, 1989
ISBN 10: 0792390253 ISBN 13: 9780792390251
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 148 pages, biography. BIC Classification: TJF. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 11. Weight in Grams: 410. . 1989. Hardback. . . . .
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Condition: New.
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Gebunden. Condition: New.
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Neural Models and Algorithms for Digital Testing
Language: English
Published by Kluwer Academic Publishers, 1991
ISBN 10: 0792391659 ISBN 13: 9780792391654
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 197 pages, biography. BIC Classification: T; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 12. Weight in Grams: 1030. . 1991. Hardback. . . . .
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Concurrent and Comparative Discrete Event Simulation
Language: English
Published by Kluwer Academic Publishers, 1993
ISBN 10: 0792394119 ISBN 13: 9780792394112
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. In the design experimentation of nuclear power plant operations, many scenarios can be simulated to derive desirable designs or safe operating procedures. Concurrent fault simulation is a technique in the computer aided design of digital systems. This book covers an application area in the scientific and business world. Num Pages: 186 pages, biography. BIC Classification: TJFC; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 12. Weight in Grams: 470. . 1993. Hardback. . . . .
