Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
Kwang-Ting (Tim) Cheng; Agrawal, Vishwani D.
From Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
AbeBooks Seller since 25 March 2015
New - Hardcover
Quantity: Over 20 available
Add to basket