Unified Methods for VLSI Simulation and Test Generation: 73 (The Springer International Series in Engineering and Computer Science, 73) - Hardcover
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Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
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hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! Seller Inventory # S_410969763
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Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
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Condition: acceptable. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear such as cover tears discoloration, staining, marks, scuffs, etc. All pages intact. Seller Inventory # GWSVV.0792390253.A
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Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
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Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
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Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
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Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
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Unified Methods for VLSI Simulation and Test Generation:
Published by
Boston. Kluwer Academic, 1989
ISBN 10: 0792390253
ISBN 13: 9780792390251
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Seller: avelibro OHG, Dinkelscherben, Germany
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8° , Hardcover/Pappeinband. Condition: Sehr gut. XII, 148 Seiten. Mit Illustrationen. Ausgetragenes Bibliotheksexemplar mit Inventaraufkleber auf Rücken und Vorsatz. Leihkarte in Tasche am Nachsatz. In sehr gutem Zustand. DE-10-19e Sprache: Englisch Gewicht in Gramm: 435. Seller Inventory # 1873643
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Unified Methods for VLSI Simulation and Test Generation
Seller: Books Puddle, New York, NY, U.S.A.
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Condition: New. pp. 164. Seller Inventory # 263051309
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Unified Methods for VLSI Simulation and Test Generation
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Seller Inventory # 5971212
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Unified Methods for VLSI Simulation and Test Generation
Published by
Kluwer Academic Publishers, 1989
ISBN 10: 0792390253
ISBN 13: 9780792390251
New
Hardcover
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
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Condition: New. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 148 pages, biography. BIC Classification: TJF. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 11. Weight in Grams: 410. . 1989. Hardback. . . . . Seller Inventory # V9780792390251