Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits: 17 (Frontiers in Electronic Testing, 17)

Bushnell, M.; Agrawal, Vishwani

ISBN 10: 0792379918 / ISBN 13: 9780792379911

Published by Kluwer Academic Publishers, USA, 2004

About this Item

Slight knock to front and back. Previous owner's name and date on top corner of front page. Black and white illustrations. Clean copy - appears as new and unused.

Seller Inventory # 002728

Bibliographic Details

• Title: Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits: 17 (Frontiers in Electronic Testing, 17)
• Publisher: Kluwer Academic Publishers, USA
• Publication Date: 2004
• Language: English
• ISBN 10: 0792379918
• ISBN 13: 9780792379911
• Binding: Hardcover
• Condition: Very Good
• Dust Jacket Condition: No Jacket

About this title

Synopsis

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Synopsis

Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means "meeting the user's needs at a minimum cost". The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip.