Synopsis
Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial. Graphs and illustrations are featured in most pages. Topics include fault modeling, test generation, test evaluation, testability analysis, design for testability, and automatic test equipment. Annotation copyright Book News, Inc. Portland, Or.
"synopsis" may belong to another edition of this title.
Synopsis
Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial. Graphs and illustrations are featured in most pag
"About this title" may belong to another edition of this title.
Search results for Test Generation for Very Large Scale Integration Chips
Stock Image
Test Generation for VLSI Chips
Seller: Rob the Book Man, Vancouver, WA, U.S.A.
Seller rating 5 out of 5 stars
Hardcover. Condition: Very Good. hardcover in very good + condition. Seller Inventory # 600383
Stock Image
Tutorial: Test Generation for Vlsi Chips
Seller: Ammareal, Morangis, France
Seller rating 5 out of 5 stars
Hardcover. Condition: Bon. Ancien livre de bibliothèque. Petite(s) trace(s) de pliure sur la couverture. Légères traces d'usure sur la couverture. Salissures sur la tranche. Couverture différente. Edition 1988. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisat ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Slightly creased cover. Slight signs of wear on the cover. Stains on the edge. Different cover. Edition 1988. Ammareal gives back up to 15% of this item's net price to charity organizations. Seller Inventory # E-812-693
Stock Image
Tutorial: Test Generation for Vlsi Chips
Published by
IEEE Computer Society Press,U.S., 1988
ISBN 10: 081868786X
ISBN 13: 9780818687860
Used
Hardcover
Seller: Buchpark, Trebbin, Germany
Seller rating 5 out of 5 stars
Condition: Sehr gut. Zustand: Sehr gut | Seiten: 400 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar. Seller Inventory # 42682699/202
Stock Image
Tutorial: Test Generation for Vlsi Chips
Seller: BOOKWEST, Phoenix, AZ, U.S.A.
Seller rating 4 out of 5 stars
Hardcover. Condition: New. US SELLER SHIPS FAST FROM USA. Seller Inventory # 110C1-081868786X