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Semiconductor Reliability (271 results)
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Reliability and Degradation: Semiconductor Devices and Circuits (Wiley Series in Solid State Devices and Circuits)
Seller: BoundlessBookstore, Wallingford, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Ex library. Light wear to boards. Content is clean with light age tone. Good DJ with light edge wear, some fading.
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Semiconductor Memories : Technology, Testing, and Reliability
Language: English
Published by Wiley & Sons, Incorporated, John, 2002
ISBN 10: 0780310004 ISBN 13: 9780780310001
Condition: Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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Condition: very_good. Pages are clean with no markings. May show minor signs of wear or cosmetic defects marks, cuts, bends, or scuffs on the cover, spine, pages, or dust jacket. May have remainder marks on edges.
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Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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hardcover. Condition: Good. Ex-library book with typical stickers and stampings. Priority Mail is available on this item. No international shipping.
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Hardcover. Condition: UsedGood. Hardcover; surplus library copy with the usual stampings; reference number taped to dust jacket spine; fading and shelf wear to exterior; in good condition with clean text, firm binding. Dust jacket, fading and shelf wear, protected by a Mylar cover.
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hardcover. Condition: Good. Dust Jacket Condition: DJ: Good. 400 pp. 6 1/4 x 9 1/4. Blue cloth covered boards, stamped in yellow on spine. Light wear at head and foot of spine. White dj, yellowing with age, moderate edgewear.
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Condition: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1150grams, ISBN:9780780310001.
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Semiconductor Reliability, V2
Language: English
Published by Literary Licensing, LLC, 2013
ISBN 10: 1258727110 ISBN 13: 9781258727116
Condition: New.
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Semiconductor Reliability, V2 (Paperback or Softback)
Language: English
Published by Literary Licensing, LLC 5/18/2013, 2013
ISBN 10: 1258727110 ISBN 13: 9781258727116
Paperback or Softback. Condition: New. Semiconductor Reliability, V2. Book.
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Semiconductor Reliability, V2
Language: English
Published by Literary Licensing, LLC, 2013
ISBN 10: 1258727110 ISBN 13: 9781258727116
Condition: As New. Unread book in perfect condition.
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Condition: As New. Unread book in perfect condition.
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Semiconductor Reliability, V2
Language: English
Published by Literary Licensing, LLC, 2013
ISBN 10: 1258718405 ISBN 13: 9781258718404
Condition: New.
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Semiconductor Reliability, V2 (Hardback or Cased Book)
Language: English
Published by Literary Licensing, LLC 5/18/2013, 2013
ISBN 10: 1258718405 ISBN 13: 9781258718404
Hardback or Cased Book. Condition: New. Semiconductor Reliability, V2. Book.
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Reliability and Degradation: Semiconductor Devices and Circuits (Wiley Series in Solid State Devices & Circuits)
Language: English
Published by U.S.A.: John Wiley & Sons Ltd, 1981
ISBN 10: 0471280283 ISBN 13: 9780471280286
First Edition
Hardcover. Condition: Very Good. Dust Jacket Condition: Very Good. 1st Edition. hardback book and dust jacket in very good-plus condition,from private company library.
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Semiconductor Reliability, V2
Language: English
Published by Literary Licensing, LLC, 2013
ISBN 10: 1258718405 ISBN 13: 9781258718404
Condition: As New. Unread book in perfect condition.
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New Approaches to Reliability Qualification of Semiconductor Components under Varying and Progressive Stresses
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 38.32
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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New Approaches to Reliability Qualification of Semiconductor Components under Varying and Progressive Stresses
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Semiconductor Reliability, V2
Language: English
Published by Literary Licensing, LLC, 2013
ISBN 10: 1258727110 ISBN 13: 9781258727116
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Reliability and Materials Issues of III?V and II?VI Semiconductor Optical and Electron Devices and Materials II
Language: English
Published by Materials Research Society, 2012
ISBN 10: 160511409X ISBN 13: 9781605114095
Condition: New. pp. xiii + 195.
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Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices
Seller: Bay State Book Company, North Smithfield, RI, U.S.A.
Seller rating 5 out of 5 stars
Condition: very_good.
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Semiconductor Laser Engineering, Reliability and Diagnostics : A Practical Approach to High Power and Single Mode Devices
Language: English
Published by Wiley & Sons, Incorporated, John, 2013
ISBN 10: 1119990335 ISBN 13: 9781119990338
Condition: Very Good. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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Reliability And Materials Issues Of Iiiā"V And Iiā"Vi Semiconductor Optical And Electron Devices And Materials Ii
Language: English
Published by Materials Research Society, 2012
ISBN 10: 160511409X ISBN 13: 9781605114095
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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RELIABILITY AND MATERIALS ISSUES OF IIIĀ"V AND IIĀ"VI SEMICONDUCTOR OPTICAL AND ELECTRON DEVICES AND MATERIALS II
Language: English
Published by Materials Research Society, 2012
ISBN 10: 160511409X ISBN 13: 9781605114095
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Semiconductor Reliability, V2
Language: English
Published by Literary Licensing, LLC, 2013
ISBN 10: 1258727110 ISBN 13: 9781258727116
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Reliability and Materials Issues of III?V and II?VI Semiconductor Optical and Electron Devices and Materials II
Language: English
Published by Materials Research Society, 2012
ISBN 10: 160511409X ISBN 13: 9781605114095
Condition: New. pp. xiii + 195 137 Illus.
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New Approaches to Reliability Qualification of Semiconductor Components under Varying and Progressive Stresses
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Reliability And Materials Issues Of Iiiā"V And Iiā"Vi Semiconductor Optical And Electron Devices And Materials Ii
Language: English
Published by Materials Research Society, 2012
ISBN 10: 160511409X ISBN 13: 9781605114095
Condition: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
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Reliability and Degradation of Semiconductor Lasers and LEDs (Optoelectronics Library)
Language: English
Published by Artech House Publishers, 1991
ISBN 10: 0890064652 ISBN 13: 9780890064658
Seller: Bay State Book Company, North Smithfield, RI, U.S.A.
Seller rating 5 out of 5 stars
Condition: very_good.
