Semiconductor Reliability (271 results)

Hardback. Condition: Fair. Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing. * Memory stacks and multichip modules for gigabyte storage.…

Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Hardcover. Condition: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.

Hardcover. Condition: Very Good. No Jacket. Missing dust jacket; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Hardback. Condition: Fair. Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing. * Memory stacks and multichip modules for gigabyte storage.…

Condition: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.

Soft Cover. Condition: Very Good. Softcovers; in very good condition.

Hardcover. Condition: UsedGood. Hardcover; surplus library copy with the usual stampings; reference number taped to dust jacket spine; fading and shelf wear to exterior; in good cond ition with clean text, firm binding. Dust jacket, fading and shelf wear, pr otected by a Mylar cover.

hardcover. Condition: Good. Ex-library book with typical stickers and stampings. Priority Mail is available on this item. No international shipping.

Condition: Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

hardcover. Condition: Good. DJ: Good. 400 pp. 6 1/4 x 9 1/4. Blue cloth covered boards, stamped in yellow on spine. Light wear at head and foot of spine. White dj, yellowing with age, moderate edgewear.

Condition: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1150grams, ISBN:9780780310001.…

Condition: New.

Paperback or Softback. Condition: New. Semiconductor Reliability, V2. Book.

Condition: New.

Condition: As New. Unread book in perfect condition.

Condition: New.

Condition: As New. Unread book in perfect condition.

Paperback. Condition: New.

Condition: New.

Hardback or Cased Book. Condition: New. Semiconductor Reliability, V2. Book.

Hardcover. Condition: Very Good. Dust Jacket Condition: Very Good. 1st Edition. hardback book and dust jacket in very good-plus condition,from private company library.

Condition: New.

Condition: As New. Unread book in perfect condition.

Hardcover. Condition: UsedGood. Hardcover; based on the conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961, in Washington, D.C.; surplus li brary copy with the usual stampings; reference number taped to spine; edge wear, fading, scuffing to cover; otherwise contents in good condition with clean text, tight binding.…

Condition: New.

Condition: New. In English.

Condition: New.

Condition: As New. Unread book in perfect condition.

Condition: New.