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Reliability and Degradation: Semiconductor Devices and Circuits (Wiley Series in Solid State Devices and Circuits) - Hardcover

 
9780471280286: Reliability and Degradation: Semiconductor Devices and Circuits (Wiley Series in Solid State Devices and Circuits)

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M. J. Howes et David Vernon Morgan
Published by John Wiley & Sons Ltd, 1981
ISBN 10: 0471280283 ISBN 13: 9780471280286
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Seller: Ammareal, Morangis, France

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Hardcover. Condition: Moyen. Ancien livre de bibliothèque. Traces d'usure sur la couverture. Couverture différente. Edition 1981. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Acceptable. Former library book. Signs of wear on the cover. Different cover. Edition 1981. Ammareal gives back up to 15% of this item's net price to charity organizations. Seller Inventory # E-065-993

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Howes, M.J. and David Vernon Morgan (eds)
Published by John Wiley and Sons Ltd, 1981
ISBN 10: 0471280283 ISBN 13: 9780471280286
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Seller: J. HOOD, BOOKSELLERS, ABAA/ILAB, Baldwin City, KS, U.S.A.

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Hardcover. 444pp. Near new condition, covers bright, text clean & binding tight in a like dust jacket. Seller Inventory # 221070

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Howes, M. J.; Morgan, David Vernon
Published by U.S.A.: John Wiley & Sons Ltd, 1981
ISBN 10: 0471280283 ISBN 13: 9780471280286
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Seller: Bingo Books 2, Vancouver, WA, U.S.A.

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Hardcover. Condition: Very Good. Dust Jacket Condition: Very Good. 1st Edition. hardback book and dust jacket in very good-plus condition,from private company library. Seller Inventory # 129419

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