Items related to Semiconductor Memories: Technology, Testing, and Reliability
Synopsis
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.
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About the Author
ASHOK K. SHARMA is the author of Semiconductor Memories: Technology, Testing, and Reliability. He is currently working as a reliability engineering manager at NASA, Goddard Space Flight Center, Greenbelt, Maryland.
"About this title" may belong to another edition of this title.
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Semiconductor Memories : Technology, Testing, and Reliability
Published by
Wiley & Sons, Incorporated, John, 2002
ISBN 10: 0780310004
ISBN 13: 9780780310001
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Semiconductor Memories: Technology, Testing, and Reliability
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Semiconductor Memories : Technology, Testing, and Reliability
Published by
Wiley & Sons, Incorporated, John, 2002
ISBN 10: 0780310004
ISBN 13: 9780780310001
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Semiconductor Memories: Technology, Testing, and Reliability
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Semiconductor Memories: Technology, Testing, and Reliability
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Semiconductor Memories: Technology, Testing, and Reliability
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John Wiley & Sons 24.09.2002., 2002
ISBN 10: 0780310004
ISBN 13: 9780780310001
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Semiconductor Memories: Technology, Testing, and Reliability
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Wiley-IEEE Pressieee Press, New York, NY, 1997
ISBN 10: 0780310004
ISBN 13: 9780780310001
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Semiconductor Memories: Technology, Testing, and Reliability
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Semiconductor Memories: Technology, Testing, and Reliability
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