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Nanometer Scale Defect Detection Using by Dahoo Pierre Richard (16 results)
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Condition: As New. Unread book in perfect condition.
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Condition: New.
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Nanometer-scale Defect Detection Using Polarized Light
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Nanometer-scale Defect Detection Using Polarized Light
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Nanometer-scale Defect Detection Using Polarized Light
Language: English
Published by ISTE Ltd and John Wiley and Sons Inc, GB, 2016
ISBN 10: 1848219369 ISBN 13: 9781848219366
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
Seller rating 5 out of 5 stars
Hardback. Condition: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.
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Nanometer-scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems)
Language: English
Published by ISTE Ltd. 2016-08-12, 2016
ISBN 10: 1848219369 ISBN 13: 9781848219366
Hardcover. Condition: New.
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Condition: New. Brand new! Please provide a physical shipping address.
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Nanometer-scale Defect Detection Using Polarized Light
Language: English
Published by ISTE Ltd and John Wiley & Sons Inc, 2016
ISBN 10: 1848219369 ISBN 13: 9781848219366
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
Hardback. Condition: New. New copy - Usually dispatched within 4 working days.
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Nanometer-Scale Defect Detection Using Polarized Light
Language: English
Published by ISTE Ltd and John Wiley & Sons Inc, 2016
ISBN 10: 1848219369 ISBN 13: 9781848219366
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
First Edition
Condition: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Num Pages: 316 pages, black & white illustrations. BIC Classification: TBN; TGMT; TTB. Category: (P) Professional & Vocational. Dimension: 242 x 164 x 22. Weight in Grams: 622. . 2016. 1st Edition. Hardcover. . . . .
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Nanometer-Scale Defect Detection Using Polarized Light
Language: English
Published by John Wiley & Sons, Ltd., 2015
ISBN 10: 1848219369 ISBN 13: 9781848219366
Condition: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.Klappentext.
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Nanometer-scale Defect Detection Using Polarized Light
Language: English
Published by Iste/Hermes Science Pub, 2016
ISBN 10: 1848219369 ISBN 13: 9781848219366
Hardcover. Condition: Brand New. 200 pages. 10.00x6.50x1.00 inches. In Stock.
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Nanometer-Scale Defect Detection Using Polarized Light
Language: English
Published by ISTE Ltd and John Wiley & Sons Inc, 2016
ISBN 10: 1848219369 ISBN 13: 9781848219366
Condition: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Num Pages: 316 pages, black & white illustrations. BIC Classification: TBN; TGMT; TTB. Category: (P) Professional & Vocational. Dimension: 242 x 164 x 22. Weight in Grams: 622. . 2016. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.
-
Nanometer-scale Defect Detection Using Polarized Light
Language: English
Published by ISTE Ltd and John Wiley and Sons Inc, GB, 2016
ISBN 10: 1848219369 ISBN 13: 9781848219366
Hardback. Condition: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.
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Buch. Condition: Neu. Neuware - This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
-
Nanometer-scale Defect Detection Using Polarized Light
Language: English
Published by Iste/Hermes Science Pub, 2016
ISBN 10: 1848219369 ISBN 13: 9781848219366
Hardcover. Condition: Brand New. 200 pages. 10.00x6.50x1.00 inches. In Stock. This item is printed on demand.
