Nanometer Scale Defect Detection Using by Dahoo Pierre Richard (16 results)
Nanometer-scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems, 2)
Dahoo, Pierre-Richard; Pougnet, Philippe; El Hami, Abdelkhalak
- Hardcover
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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£ 112.07
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Condition: New.
Nanometer-scale Defect Detection Using Polarized Light
Dahoo, Pierre Richard; Pougnet, Philippe; El Hami, Abdelkhalak
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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£ 116.74
£ 1.95 shippingShips within U.S.A.Quantity: 8 available
Condition: New.
Nanometer-scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems, 2)
Dahoo, Pierre-Richard; Pougnet, Philippe; El Hami, Abdelkhalak
- Hardcover
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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£ 117.82
£ 8.50 shippingShips from Germany to U.S.A.Quantity: 1 available
Condition: New.
Nanometer-scale Defect Detection Using Polarized Light
Dahoo, Pierre Richard; Pougnet, Philippe; El Hami, Abdelkhalak
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
£ 128.11
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Condition: As New. Unread book in perfect condition.
Nanometer-scale Defect Detection Using Polarized Light
Dahoo, Pierre Richard; Pougnet, Philippe; El Hami, Abdelkhalak
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
£ 115.59
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: 8 available
Condition: New.
Nanometer-scale Defect Detection Using Polarized Light
Dahoo, Pierre Richard; Pougnet, Philippe; El Hami, Abdelkhalak
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
£ 130.06
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: 8 available
Condition: As New. Unread book in perfect condition.
Nanometer-scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems, 2)
Dahoo, Pierre-Richard; Pougnet, Philippe; El Hami, Abdelkhalak
- Hardcover
Seller: California Books, Miami, FL, U.S.A.California Books
Contact seller4-star sellerCondition: New
£ 153.23
Free ShippingShips within U.S.A.Quantity: Over 20 available
Condition: New.
Language: English
Published by ISTE Ltd and John Wiley and Sons Inc, GB, 2016
- Hardcover
Seller: Rarewaves.com USA, London, LONDO, United KingdomRarewaves.com USA
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£ 156.98
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Hardback. Condition: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with…techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.
- Hardcover
Seller: Chiron Media, Wallingford, United KingdomChiron Media
Contact seller5-star sellerCondition: New
£ 146.16
£ 15.49 shippingShips from United Kingdom to U.S.A.Quantity: 2 available
Hardcover. Condition: New.
Nanometer-scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems, 2)
Dahoo, Pierre-Richard; Pougnet, Philippe; El Hami, Abdelkhalak
- Hardcover
Seller: Ubiquity Trade, Miami, FL, U.S.A.Ubiquity Trade
Contact seller5-star sellerCondition: New
£ 163.64
£ 2.22 shippingShips within U.S.A.Quantity: Over 20 available
Condition: New. Brand new! Please provide a physical shipping address.
- Hardcover
- First Edition
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrelandKennys Bookshop and Art Galleries Ltd.
Contact seller5-star sellerCondition: New
£ 161.10
£ 8.12 shippingShips from Ireland to U.S.A.Quantity: 15 available
Condition: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Num Pages: 316 pages, black & white illustrations. BIC Classification: TBN; T…GMT; TTB. Category: (P) Professional & Vocational. Dimension: 242 x 164 x 22. Weight in Grams: 622. . 2016. 1st Edition. Hardcover. . . . .
- Hardcover
Seller: THE SAINT BOOKSTORE, Southport, United KingdomTHE SAINT BOOKSTORE
Contact seller5-star sellerCondition: New
£ 147.33
£ 16.93 shippingShips from United Kingdom to U.S.A.Quantity: 2 available
Hardback. Condition: New. New copy - Usually dispatched within 4 working days.
Nanometer-scale Defect Detection Using Polarized Light
Dahoo, Pierre Richard/ Pougnet, Philippe/ El Hami, Abdelkhalak
- Hardcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
£ 182.87
£ 12.50 shippingShips from United Kingdom to U.S.A.Quantity: 2 available
Hardcover. Condition: Brand New. 200 pages. 10.00x6.50x1.00 inches. In Stock.
- Hardcover
Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
Contact seller5-star sellerCondition: New
£ 194.59
£ 7.77 shippingShips within U.S.A.Quantity: 15 available
Condition: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Num Pages: 316 pages, black & white illustrations. BIC Classification: TBN; T…GMT; TTB. Category: (P) Professional & Vocational. Dimension: 242 x 164 x 22. Weight in Grams: 622. . 2016. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.
Language: English
Published by ISTE Ltd and John Wiley and Sons Inc, GB, 2016
- Hardcover
Seller: Rarewaves.com UK, London, United KingdomRarewaves.com UK
Contact seller5-star sellerCondition: New
£ 144.23
£ 65.00 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Hardback. Condition: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with…techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.
Nanometer-scale Defect Detection Using Polarized Light
Dahoo, Pierre Richard/ Pougnet, Philippe/ El Hami, Abdelkhalak
- Hardcover
- Print on Demand
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
£ 174.47
£ 12.50 shippingShips from United Kingdom to U.S.A.Quantity: 2 available
Hardcover. Condition: Brand New. 200 pages. 10.00x6.50x1.00 inches. In Stock. This item is printed on demand.
