Nanometer-scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems, 2)

Dahoo, Pierre-Richard; Pougnet, Philippe; El Hami, Abdelkhalak

ISBN 10: 1848219369 ISBN 13: 9781848219366
Published by Wiley-ISTE, 2016
Language: English
Condition: New Hardcover

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