Nanometer-scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems)

Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami

ISBN 10: 1848219369 ISBN 13: 9781848219366
Published by ISTE Ltd. 2016-08-12, 2016
Language: English
Condition: New Hardcover

Sold by Chiron Media, Wallingford, United Kingdom

AbeBooks Seller since 2 August 2010

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

View this seller's items


New - Hardcover

Condition: New

Price:
£ 146.16
£ 15.49 shipping
Ships from United Kingdom to U.S.A.

Quantity: 2 available

Add to basket