Nanometer-scale Defect Detection Using Polarized Light

Language: English

Published by ISTE Ltd and John Wiley and Sons Inc, GB, 2016

1848219369 / 9781848219366

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This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.

Seller Inventory # LU-9781848219366

Title
Nanometer-scale Defect Detection Using Polarized Light
Author
Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
Publisher
ISTE Ltd and John Wiley and Sons Inc, GB
Publication year
2016
Condition
New
Binding
Hardback
Language
English
ISBN 10
1848219369
ISBN 13
9781848219366
Item weight
612 grams

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