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Advanced Test Methods Srams by Bosio Alberto (23 results)
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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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Condition: New.
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Condition: New. pp. 188.
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Condition: New. pp. 188.
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Taschenbuch. Condition: Neu. Advanced Test Methods for SRAMs | Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies | Alberto Bosio (u. a.) | Taschenbuch | xv | Englisch | 2014 | Springer US | EAN 9781489983145 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Language: English
Published by Springer US, Springer New York, 2014
ISBN 10: 1489983147 ISBN 13: 9781489983145
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book.
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book.
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Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 144.99
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Add to basketCondition: As New. Unread book in perfect condition.
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Hardcover. Condition: Like New. Like New. book.
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Condition: As New. Unread book in perfect condition.
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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Language: English
Published by Springer-Verlag New York Inc., 2014
ISBN 10: 1489983147 ISBN 13: 9781489983145
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
£ 94.70
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Add to basketPaperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
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Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Language: English
Published by SPRINGER NATURE Nov 2009, 2009
ISBN 10: 1441909370 ISBN 13: 9781441909374
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book. 171 pp. Englisch.
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Advanced Test Methods for SRAMs
Language: English
Published by Springer US Sep 2014, 2014
ISBN 10: 1489983147 ISBN 13: 9781489983145
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book. 188 pp. Englisch.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book to present complete, state-of-the-art coverage of dynamic fault memory testingPresents content using a bottom-up approach, from the electrical causes of malfunction up to the generation of smart test strategiesIncludes case stu.
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book to present complete, state-of-the-art coverage of dynamic fault memory testingPresents content using a bottom-up approach, from the electrical causes of malfunction up to the generation of smart test strategiesIncludes case stu.
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Condition: New. Print on Demand pp. 188 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
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Condition: New. Print on Demand pp. 188.
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Condition: New. PRINT ON DEMAND pp. 188.
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Condition: New. PRINT ON DEMAND pp. 188.
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Advanced Test Methods for SRAMs
Language: English
Published by Springer US, Springer New York Sep 2014, 2014
ISBN 10: 1489983147 ISBN 13: 9781489983145
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 188 pp. Englisch.
