Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud

ISBN 10: 1441909370 ISBN 13: 9781441909374
Published by Springer, 2009
Language: English
Condition: New Hardcover

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