Virazel Arnaud (13 results)
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
£ 81.52
£ 11.98 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.
Advanced Test Methods for Srams : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
£ 96.84
£ 1.98 shippingShips within U.S.A.Quantity: 15 available
Condition: New.
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
£ 96.88
£ 11.98 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.
Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
£ 96.87
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.
Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
£ 113.14
£ 1.98 shippingShips within U.S.A.Quantity: Over 20 available
Condition: New.
Advanced Test Methods for Srams : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
£ 115.29
£ 1.98 shippingShips within U.S.A.Quantity: 15 available
Condition: As New. Unread book in perfect condition.
Advanced Test Methods for SRAMs: Effective Solutions for.
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
£ 128.51
£ 2.99 shippingShips within U.S.A.Quantity: 4 available
Condition: New. pp. 188.
Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
£ 144.99
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
£ 169.66
£ 1.98 shippingShips within U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Advanced Test Methods for SRAMs
Alberto Bosio|Luigi Dilillo|Patrick Girard|Serge Pravossoudovitch|Arnaud Virazel
- Softcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
£ 81.29
£ 41.85 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book to present complete, state-of-the-art coverage of dynamic fault memory testingPresents content using a bottom-up approach, from the electrical causes of malfunction up to the generation of smart test strate…giesIncludes case stu.
Advanced Test Methods for SRAMs
Alberto Bosio|Luigi Dilillo|Patrick Girard|Serge Pravossoudovitch|Arnaud Virazel
- Hardcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
£ 81.83
£ 41.85 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book to present complete, state-of-the-art coverage of dynamic fault memory testingPresents content using a bottom-up approach, from the electrical causes of malfunction up to the generation of smart t…est strategiesIncludes case stu.
Advanced Test Methods for SRAMs: Effective Solutions for.
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Softcover
- Print on Demand
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
Contact seller4-star sellerCondition: New
£ 134.70
£ 6.50 shippingShips from United Kingdom to U.S.A.Quantity: 4 available
Condition: New. Print on Demand pp. 188.
Advanced Test Methods for SRAMs: Effective Solutions for.
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Softcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
Contact seller4-star sellerCondition: New
£ 138.70
£ 8.50 shippingShips from Germany to U.S.A.Quantity: 4 available
Condition: New. PRINT ON DEMAND pp. 188.
