Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Bosio, Alberto

ISBN 10: 1489983147 ISBN 13: 9781489983145
Published by Springer 2014-09, 2014
Language: English
Condition: New Soft cover

Sold by Chiron Media, Wallingford, United Kingdom

AbeBooks Seller since 2 August 2010

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

View this seller's items


New - Soft cover

Condition: New

Price:
£ 79.07
£ 15.49 shipping
Ships from United Kingdom to U.S.A.

Quantity: 10 available

Add to basket