ISBN: 9781489983145 - Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies (13 results)

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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book.…

Condition: New. pp. 188.

Taschenbuch. Condition: Neu. Advanced Test Methods for SRAMs | Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies | Alberto Bosio (u. a.) | Taschenbuch | xv | Englisch | 2014 | Humana | EAN 9781489983145 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book. 188 pp. Englisch.…

Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book to present complete, state-of-the-art coverage of dynamic fault memory testingPresents content using a bottom-up approach, from the electrical causes of malfunction up to the generation of smart test strategiesIncludes case stu.…

Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 188 pp. Englisch.…

Condition: New. Print on Demand pp. 188.

Condition: New. PRINT ON DEMAND pp. 188.