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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Condition: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1200grams, ISBN:9780521554909.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Condition: New.
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Characterization of High Tc Materials and Devices by Electron Microscopy (Paperback or Softback)
Language: English
Published by Cambridge University Press 11/23/2006, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Paperback or Softback. Condition: New. Characterization of High Tc Materials and Devices by Electron Microscopy. Book.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Condition: New.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Condition: As New. Unread book in perfect condition.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 49.42
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press 2006-11-23, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Paperback. Condition: New.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Add to basketHardcover. Condition: Bon. Ancien livre de bibliothèque avec équipements. Edition 2012. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Edition 2012. Ammareal gives back up to 15% of this item's net price to charity organizations.
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£ 58.36 10% off
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Add to basketHardcover. Condition: Bon. Ancien livre de bibliothèque avec équipements. Edition 2012. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Edition 2012. Ammareal gives back up to 15% of this item's net price to charity organizations.
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£ 58.36 10% off
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Ships from France to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Bon. Ancien livre de bibliothèque avec équipements. Edition 2012. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Edition 2012. Ammareal gives back up to 15% of this item's net price to charity organizations.
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Oxygen, Carbon, Hydrogen and Nitrogen in Crystalline Silicon: Symposiumheld December 2-5, 1985, Boston, Massachusetts, U.S.A. (Materials Research Society Symposia Proceedings)
Language: English
Published by Materials Research Society, 1986
ISBN 10: 0931837243 ISBN 13: 9780931837241
Hardcover. Condition: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
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Characterization Of High Tc Materials And Devices By Electron Microscopy
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Characterization Of High Tc Materials And Devices By Electron Microscopy
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors. Editor(s): Browning, Nigel D.; Pennycook, Stephen. Num Pages: 408 pages, 267 b/w illus. 3 tables. BIC Classification: PHFC; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 21. Weight in Grams: 650. . 2006. Illustrated. paperback. . . . .
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Characterization Of High Tc Materials And Devices By Electron Microscopy
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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CHARACTERIZATION OF HIGH TC MATERIALS AND DEVICES BY ELECTRON MICROSCOPY
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Condition: New. A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors. Editor(s): Browning, Nigel D.; Pennycook, Stephen. Num Pages: 408 pages, 267 b/w illus. 3 tables. BIC Classification: PHFC; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 21. Weight in Grams: 650. . 2006. Illustrated. paperback. . . . . Books ship from the US and Ireland.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of new superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunneling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is also discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included. This book will interest graduate students and researchers in condensed matter physics and material science.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2015
ISBN 10: 052155490X ISBN 13: 9780521554909
Condition: Sehr gut. Zustand: Sehr gut | Seiten: 406 | Sprache: Englisch | Produktart: Bücher | A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.
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£ 135.22 10% off
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Ships from France to U.S.A.Quantity: 1 available
Add to basketCondition: Bon. Ancien livre de bibliothèque avec équipements. Edition 2012. Tome 1. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Edition 2012. Volume 1. Ammareal gives back up to 15% of this item's net price to charity organizations.
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Oxygen, Carbon, Hydrogen and Nitrogen in Crystalline Silicon Symposiumheld December 2-5, 1985, Boston, Massachusetts, U. S. A.
Language: English
Published by Materials Research Society, Warrendale, PA, 1986
ISBN 10: 0931837243 ISBN 13: 9780931837241
Seller: True Oak Books, Highland, NY, U.S.A.
Association Member: IOBA
Seller rating 5 out of 5 stars
First Edition
Hardcover. Condition: Good+. Dust Jacket Condition: No Dust Jacket. Materials Research Society Symposia Proceedings; 6.5 X 1.75 X 9.5 inches; 579 pages; graphs. Ex-Library copy with usual identifiers. Minor yellowing on pages. Very Good condition otherwise. No other noteworthy defects. No markings on text pages. ; - Your satisfaction is our priority. We offer free returns and respond promptly to all inquiries. Your item will be carefully cushioned in bubble wrap and securely boxed. All orders ship on the same or next business day. Buy with confidence. 1st Edition (Unstated); No Printing Stated.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 141.88
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Condition: New.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors. Editor(s): Browning, Nigel D.; Pennycook, Stephen J. Num Pages: 406 pages, 267 b/w illus. 3 tables. BIC Classification: PHFC; PHK; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 24. Weight in Grams: 1125. . 2000. Illustrated. hardcover. . . . .
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Scanning Transmission Electron Microscopy: Imaging and Analysis
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 167.27
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Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Hardcover. Condition: Fine. 3527317066 ** Complete 2-Volume Set **; Like New; Hardcover; Close to new condition; Covers are still glossy with "straight" edge-corners; Unblemished textblock edges; The endpapers and all text pages of both volumes are bright and unmarked; Binding is tight with a straight spine; This book will be stored and delivered in a sturdy cardboard box with foam padding; Medium Format (8.5" - 9.75" tall); Heavy (6.8 lbs); White, blue, and orange covers with title in black lettering; 2012, Wiley-VCH Publishing; 1450 pages; "Handbook of Nanoscopy," by Gustaaf van Tendeloo, et al.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Hardcover. Condition: Like New. Like New. book.
