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Synopsis
A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.
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Review
'... a useful and nearly comprehensive guide to current work in the subject.' J. P. Davey, Contemporary Physics
Book Description
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
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Characterization of High Tc Materials and Devices by Electron Microscopy (Paperback or Softback)
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Cambridge University Press 11/23/2006, 2006
ISBN 10: 0521031702
ISBN 13: 9780521031707
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Paperback or Softback. Condition: New. Characterization of High Tc Materials and Devices by Electron Microscopy. Book. Seller Inventory # BBS-9780521031707
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Characterization of High Tc Materials and Devices by Electron Microscopy
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Cambridge University Press, 2006
ISBN 10: 0521031702
ISBN 13: 9780521031707
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Characterization of High Tc Materials and Devices by Electron Microscopy
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Cambridge University Press 2006-11-23, 2006
ISBN 10: 0521031702
ISBN 13: 9780521031707
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Paperback. Condition: New. Brand new book, sourced directly from publisher. Dispatch time is 6-7 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely. Seller Inventory # 6666-IUK-9780521031707
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Characterization of High Tc Materials and Devices by Electron Microscopy
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Cambridge University Press, 2006
ISBN 10: 0521031702
ISBN 13: 9780521031707
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Condition: New. A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors. Editor(s): Browning, Nigel D.; Pennycook, Stephen. Num Pages: 408 pages, 267 b/w illus. 3 tables. BIC Classification: PHFC; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 21. Weight in Grams: 650. . 2006. Illustrated. paperback. . . . . Seller Inventory # V9780521031707
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Characterization of High Tc Materials and Devices by Electron Microscopy
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Cambridge University Press, 2006
ISBN 10: 0521031702
ISBN 13: 9780521031707
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Characterization of High Tc Materials and Devices by Electron Microscopy
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Cambridge University Press, 2006
ISBN 10: 0521031702
ISBN 13: 9780521031707
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Seller: Kennys Bookstore, Olney, MD, U.S.A.
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Condition: New. A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors. Editor(s): Browning, Nigel D.; Pennycook, Stephen. Num Pages: 408 pages, 267 b/w illus. 3 tables. BIC Classification: PHFC; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 21. Weight in Grams: 650. . 2006. Illustrated. paperback. . . . . Books ship from the US and Ireland. Seller Inventory # V9780521031707
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Characterization of High Tc Materials and Devices by Electron Microscopy (Paperback)
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Cambridge University Press, Cambridge, 2006
ISBN 10: 0521031702
ISBN 13: 9780521031707
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Paperback. Condition: new. Paperback. This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included. This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Seller Inventory # 9780521031707
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Characterization of High Tc Materials and Devices by Electron Microscopy
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Cambridge University Press, 2006
ISBN 10: 0521031702
ISBN 13: 9780521031707
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning . Seller Inventory # 446922162
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Characterization of High Tc Materials and Devices by Electron Microscopy
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Cambridge University Press, 2006
ISBN 10: 0521031702
ISBN 13: 9780521031707
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included. Seller Inventory # 9780521031707
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Characterization of High Tc Materials and Devices by Electron Microscopy
Published by
Cambridge University Press, 2006
ISBN 10: 0521031702
ISBN 13: 9780521031707
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Taschenbuch. Condition: Neu. Characterization of High Tc Materials and Devices by Electron Microscopy | Nigel D. Browning (u. a.) | Taschenbuch | Englisch | 2006 | Cambridge University Press | EAN 9780521031707 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand. Seller Inventory # 102142202