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Synopsis
A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.
"synopsis" may belong to another edition of this title.
Review
'... a useful and nearly comprehensive guide to current work in the subject.' J. P. Davey, Contemporary Physics
Book Description
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
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Characterization of High Tc Materials and Devices by Electron Microscopy
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Cambridge University Press, 2006
ISBN 10: 0521031702
ISBN 13: 9780521031707
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Characterization of High Tc Materials and Devices by Electron Microscopy (Paperback or Softback)
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Characterization of High Tc Materials and Devices by Electron Microscopy
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ISBN 10: 0521031702
ISBN 13: 9780521031707
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Characterization of High Tc Materials and Devices by Electron Microscopy
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ISBN 10: 0521031702
ISBN 13: 9780521031707
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Characterization of High Tc Materials and Devices by Electron Microscopy
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ISBN 13: 9780521031707
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Characterization of High Tc Materials and Devices by Electron Microscopy
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Characterization of High Tc Materials and Devices by Electron Microscopy
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Characterization of High Tc Materials and Devices by Electron Microscopy
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Condition: New. A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors. Editor(s): Browning, Nigel D.; Pennycook, Stephen. Num Pages: 408 pages, 267 b/w illus. 3 tables. BIC Classification: PHFC; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 21. Weight in Grams: 650. . 2006. Illustrated. paperback. . . . . Seller Inventory # V9780521031707
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Characterization of High Tc Materials and Devices by Electron Microscopy
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Cambridge University Press, 2006
ISBN 10: 0521031702
ISBN 13: 9780521031707
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Characterization of High Tc Materials and Devices by Electron Microscopy
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