Characterization High Materials Devices by Browning Nigel (29 results)

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  • Language: English

    Published by Cambridge University Press, 2006

    0521031702 / 9780521031707

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  • Language: English

    Published by Cambridge University Press 11/23/2006, 2006

    0521031702 / 9780521031707

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    Paperback or Softback. Condition: New. Characterization of High Tc Materials and Devices by Electron Microscopy. Book.

  • Language: English

    Published by Cambridge University Press, 2006

    0521031702 / 9780521031707

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  • Language: English

    Published by Cambridge University Press 2006-11-23, 2006

    0521031702 / 9780521031707

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    Paperback. Condition: New. Brand new book, sourced directly from publisher. Dispatch time is 6-7 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.

  • Language: English

    Published by Cambridge University Press, 2006

    0521031702 / 9780521031707

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  • Language: English

    Published by Cambridge University Press, 2006

    0521031702 / 9780521031707

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  • Language: English

    Published by Cambridge University Press, 2006

    0521031702 / 9780521031707

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    Condition: New. A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors. Editor(s): Browning, Nigel D.; Pennycook, Stephen. Num Pages: 408 pages, 267 b/w illus. 3 tables. BIC Classification: PHFC; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 21. Weight in Grams: 650. . 2006. Illustrated. paperback. . . . .

  • Language: English

    Published by Cambridge University Press, 2006

    0521031702 / 9780521031707

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    Condition: New. In English.

  • Language: English

    Published by Cambridge University Press, 2000

    052155490X / 9780521554909

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  • Language: English

    Published by Cambridge University Press, 2006

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  • Language: English

    Published by Cambridge University Press, 2000

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  • Language: English

    Published by Cambridge University Press, 2000

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  • Language: English

    Published by Cambridge University Press, 2006

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    Condition: New. A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors. Editor(s): Browning, Nigel D.; Pennycook, Stephen. Num Pages: 408 pages, 267 b/w illus. 3 tables. BIC Classification: PHFC; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 21. Weight in Grams: 650. . 2006. Illustrated. paperback. . . . . Books ship from the US and Ireland.

  • Language: English

    Published by Cambridge University Press, 2000

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  • Language: English

    Published by Cambridge University Press, 2000

    052155490X / 9780521554909

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  • Language: English

    Published by Cambridge University Press, 2006

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    Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.

  • Language: English

    Published by Cambridge University Press, 2015

    052155490X / 9780521554909

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    Condition: Sehr gut. Zustand: Sehr gut | Seiten: 406 | Sprache: Englisch | Produktart: Bücher | A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.

  • Language: English

    Published by Cambridge University Press, 2000

    052155490X / 9780521554909

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  • Language: English

    Published by Cambridge University Press, 2000

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    Condition: New. A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors. Editor(s): Browning, Nigel D.; Pennycook, Stephen J. Num Pages: 406 pages, 267 b/w illus. 3 tables. BIC Classification: PHFC; PHK; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 24. Weight in Grams: 1125. . 2000. Illustrated. hardcover. . . . .

  • Language: English

    Published by Cambridge University Press, 2000

    052155490X / 9780521554909

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    Condition: New. In English.

  • Language: English

    Published by Cambridge University Press, 2000

    052155490X / 9780521554909

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  • Language: English

    Published by Cambridge University Press, 2000

    052155490X / 9780521554909

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    Condition: New. A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors. Editor(s): Browning, Nigel D.; Pennycook, Stephen J. Num Pages: 406 pages, 267 b/w illus. 3 tables. BIC Classification: PHFC; PHK; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 24. Weight in Grams: 1125. . 2000. Illustrated. hardcover. . . . . Books ship from the US and Ireland.

  • Language: English

    Published by Cambridge University Press, 2000

    052155490X / 9780521554909

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    Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.

  • Language: English

    Published by Cambridge University Press, 2006

    0521031702 / 9780521031707

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    Paperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.

  • Language: English

    Published by Cambridge University Press, Cambridge, 2006

    0521031702 / 9780521031707

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    Paperback. Condition: new. Paperback. This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included. This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.

  • Language: English

    Published by Cambridge University Press, 2006

    0521031702 / 9780521031707

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning .

  • Language: English

    Published by Cambridge University Press, Cambridge, 2000

    052155490X / 9780521554909

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    Hardcover. Condition: new. Hardcover. This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of new superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures.Detailed references are included. An account of the application of electron-based microscopies to the study of high-Tc superconductors. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.

  • Language: English

    Published by Cambridge University Press, 2015

    052155490X / 9780521554909

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    Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning .

  • Language: English

    Published by Cambridge University Press, 2000

    052155490X / 9780521554909

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