Characterization of High Tc Materials and Devices by Electron Microscopy - Hardcover

 
9780521554909: Characterization of High Tc Materials and Devices by Electron Microscopy
Hardcover
ISBN 10: 052155490X ISBN 13: 9780521554909
Publisher: Cambridge University Press, 2000

Synopsis

This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.

"synopsis" may belong to another edition of this title.

Product Description

This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.

Review

'... a useful and nearly comprehensive guide to current work in the subject.' J. P. Davey, Contemporary Physics

"About this title" may belong to another edition of this title.

Publisher
Cambridge University Press
Publication date
2000
Language
English
ISBN 10 
052155490X
ISBN 13 
9780521554909
Binding
Hardcover
Number of pages
406
Editor
Browning Nigel D., Pennycook Stephen J.

Other Popular Editions of the Same Title

9780521031707: Characterization of High Tc Materials and Devices by Electron Microscopy

Featured Edition

ISBN 10:  0521031702 ISBN 13:  9780521031707
Publisher: Cambridge University Press, 2006
Softcover