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International EditionDEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Book 18 of 40: Frontiers in Electronic TestingLanguage: English
Published by New Age International Publisher, 2010
ISBN 10: 8184894295 ISBN 13: 9788184894295
Condition: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
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DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Book 18 of 40: Frontiers in Electronic TestingLanguage: English
Published by New Age International Publisher, 2010
ISBN 10: 8184894295 ISBN 13: 9788184894295
Condition: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability.
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hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)
Book 2 of 34: Integrated Circuits and SystemsSeller: Ria Christie Collections, Uxbridge, United Kingdom
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£ 96.88
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paperback. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Thermal And Power Management of Integrated Circuits
Book 2 of 34: Integrated Circuits and SystemsSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Thermal and Power Management of Integrated Circuits
Book 2 of 34: Integrated Circuits and SystemsLanguage: English
Published by Springer-Verlag New York Inc., US, 2006
ISBN 10: 0387257624 ISBN 13: 9780387257624
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
Seller rating 5 out of 5 stars
£ 124.61
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Add to basketHardback. Condition: New. 2006 ed.
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Condition: New. pp. 192.
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Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)
Book 2 of 34: Integrated Circuits and SystemsSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 117.36
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Condition: New. pp. 352 2nd Edition.
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Condition: Sehr gut. Zustand: Sehr gut | Seiten: 352 | Sprache: Englisch | Produktart: Bücher | Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of the highest possible quality. Testing in general and defect-oriented testing in particular help in realizing these objectives. For contemporary System on Chip (SoC) VLSI circuits, testing is an activity associated with every level of integration. However, special emphasis is placed for wafer-level test, and final test. Wafer-level test consists primarily of dc or slow-speed tests with current/voltage checks per pin under most operating conditions and with test limits properly adjusted. Basic digital tests are applied and in some cases low-frequency tests to ensure analog/RF functionality are exercised as well. Final test consists of checking device functionality by exercising RF tests and by applying a comprehensive suite of digital test methods such as I , delay fault testing, DDQ stuck-at testing, low-voltage testing, etc. This partitioning choice is actually application dependent.
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Condition: very_good. This books is in Very good condition. There may be a few flaws like shelf wear and some light wear.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing, 40)
Book 21 of 40: Frontiers in Electronic TestingSeller: Ria Christie Collections, Uxbridge, United Kingdom
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£ 137.84
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, 34)
Book 18 of 40: Frontiers in Electronic TestingSeller: Ria Christie Collections, Uxbridge, United Kingdom
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Thermal and Power Management of Integrated Circuits
Book 2 of 34: Integrated Circuits and SystemsLanguage: English
Published by Springer US, Springer New York, 2010
ISBN 10: 144193832X ISBN 13: 9781441938329
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and manufacturing. Proper thermal management is the key to achieve high performance, quality and reliability. Performance and reliability of integrated circuits are strong functions of the junction temperature. A small increase in junction temperature may result in significant reduction in the device lifetime.This book reviews the significance of the junction temperature as a reliability measure under nominal and burn-in conditions. The latest research in the area of electro-thermal modeling of integrated circuits will also be presented. Recent models and associated CAD tools are covered and various techniques at the circuit and system levels are reviewed. Subsequently, the authors provide an insight into the concept of thermal runaway and how it may best be avoided. A section on low temperature operation of integrated circuits concludes the book.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test
Book 21 of 40: Frontiers in Electronic TestingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
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£ 137.83
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Condition: New. pp. 352 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
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ESD Protection Device and Circuit Design for Advanced CMOS Technologies
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ESD Protection Device and Circuit Design for Advanced CMOS Technologies
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 148.08
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Paperback. Condition: Like New. Like New. book.
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Thermal and Power Management of Integrated Circuits
Book 2 of 34: Integrated Circuits and SystemsLanguage: English
Published by Springer-Verlag New York Inc., US, 2006
ISBN 10: 0387257624 ISBN 13: 9780387257624
£ 114.13
£ 65 shipping
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Add to basketHardback. Condition: New. 2006 ed.
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Thermal And Power Management of Integrated Circuits
Book 2 of 34: Integrated Circuits and SystemsSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 162.99
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Add to basketCondition: As New. Unread book in perfect condition.
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: As New. Unread book in perfect condition.
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Taschenbuch. Condition: Neu. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies | Process-Aware SRAM Design and Test | Manoj Sachdev (u. a.) | Taschenbuch | xvi | Englisch | 2010 | Springer | EAN 9789048178551 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, 34)
Book 18 of 40: Frontiers in Electronic TestingSeller: Ria Christie Collections, Uxbridge, United Kingdom
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£ 189.04
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Condition: New. pp. 248.
