Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, 34)

Book 18 of 40: Frontiers in Electronic Testing

Sachdev, Manoj; Pineda De Gyvez, José

ISBN 10: 0387465464 ISBN 13: 9780387465463
Published by Springer, 2007
Language: English
Condition: Used - Very good Hardcover

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