Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Book 18 of 40: Frontiers in Electronic Testing

José Pineda de Gyvez, Manoj Sachdev

ISBN 10: 0387465464 ISBN 13: 9780387465463
Published by Springer US, 2007
Language: English
Condition: Used - Fine Hardcover

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Used - Hardcover

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