Holy Vaclav (31 results)

Condition: New.

Condition: As New. Unread book in perfect condition.

Hardcover. Condition: Gut. Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02760 9783540620297 Sprache: Englisch Gewicht in Gramm: 1050.

Condition: New. In English.

Condition: New.

Condition: As New. Unread book in perfect condition.

gebundene Ausgabe. Condition: Gut. 194 S. Großformatig , geb. mit dem OU.Alles sauber und gut erhalten. cs Gewicht in Gramm: 1000.

Hardcover. Condition: Very Good. 2. Auflage. Unread, some shelfwear. Immediately dispatched from Germany.

Condition: Sehr gut. 197 S. Umschlag an den Rändern minimal berieben/bestossen. Innenteil tadellos - u n g e l e s e n - keine Risse, Knicke, Anmerkungen. ! Altersbedingt leicht nachgedunkelt! KEIN Mängelexemplar! Versand aus München F06854 Sprache: Deutsch Gewicht in Gramm: 385.

Condition: New. In.

Condition: New.

8° Broschur. Condition: Gut. 197 S. Broschur. Bei dem Buch handelt es sich um ein ehemaliges Bibliotheksexemplar mit Signatur und Stempel. M08001. Sprache: Deutsch Gewicht in Gramm: 500.

hardcover. Condition: New. In shrink wrap. Looks like an interesting title.

Paperback. Condition: New. Second Edition 2004. During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap­ pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.…

Condition: New. pp. 428.

Condition: New. In.

Paperback. Condition: Brand New. 2nd edition. 410 pages. 9.00x6.00x1.00 inches. In Stock.

Condition: New.

Condition: good. A copy that has been read, remains in good condition. All pages are intact, and the cover is intact. The spine and cover show signs of wear. Pages can include notes and highlighting and show signs of wear, and the copy can include "From the library of" labels or previous owner inscriptions. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item! Ships via media mail.…

Paperback. Condition: New. Second Edition 2004. During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap­ pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.…

Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Soft cover. Condition: Fair. 183, [1] pp. ; 4 pp. ; "4000 výt./ Vyd. Oblastní galerie v Liberci./ Prehl. lit./ Nekteré fot. barev./ Obálka: Vladimír Sobolevic ; [Uv. texty:] Vladimír Ruda, Nada Reháková ; [Soubez. preklad textu do] rus. Ctirad Kucera, [do] nem. Karel Steiner ; Fot." ; OCLC: 42167505 ; text in Czech, Russian and German ; disbound in thick, color illustrated paper wrappers ; flimsy binding has given way, but text is whole ; very scarce collection of some very fine paintings reproduced primarily in black and white, with a few in color, of Czech and Slovakian artists; the gallery exhibition included works by: Jiri Balcar, Jan Bauch, Andrej Belocvetov, Vincenc Benes, Vlastimil Benes, Martin Benka, Alexander ?Beran, Karel Bohacek, Vaclav Bostik, Cyril Boud a, Miroslav Brotanek, Josef Broz, Oto Bubenicek, Josef ?Capek, Karel Cerny, Alen Divis, Bedrich Dlouhy, Bohumir Dvorsky, Frantisek Dvorak, Emanuel Famira, ?Bedrich Feigl, Emil Filla, Alois Fisarek, Frantisek Foltyn, Frantisek Gross, Jaroslav Grus, Vac lav Hejna, ?Cestmir Hlavinka, Jaromir Hlavsa, Jaroslav Hnevkovsky, Adolf Hoffmeister, Debrich Hoffstadter, Karel ?Holan, Oldrich Holub, Miroslav Holy, Jiri Hornik, Jaroslav Horanek, Antonin Hudecek, Frantisek Hudecek, ?josef Hysek, Josef Istler, Ota Janecek, Frantisek Janousek, Jaromir Jindra, Rudolf Jindrich, Josef Jira, ?Milos Jiranek, Frantisek Jiroudek, Ludmila Jirincova, Jiri John, Alfred Justitz, josef Kaderabek, Jan Kalous, ?Ladislav Karousek, Jiri Kars (Karpeles), Frantisek Kavan, Oldrich Kerhart, Jaroslav Klapste, Jan Kojan, ?Jaroslav Koliha, Oldrich Konicek, Bodhan Kopecky, Pravoslav Kotik, Vladimir Komarek, Vaclav ?Kreisenger, Jiri Krejci, Rudolf Kremlicka, Ludvik Kuba, Otakar Kubin (Othon Coubine), Bohumil Kubista, ?Otakar Lebeda, Kamil Lhotak, Josef Liesler, Cyprian Majernik, Josef Maticka, Dalibor Matous, Ota ?Matousek, Mikulas Medek, Josef mertlik, Eduard Milen, Zdenek Mlcoch, Frantisek Viktor Mokry, Alois ?Moravec, Grigorij Musatov, Frantisek Muzika, Josef Nastoupil (Carlo Na ston), Otakar Nejedly, Vaclav ?Vojtech Novak, Willi (Vilem) Nowak, Jiri Novotny, Oldrich Oplt, Arnost Paderlik, Jaroslav Paur, Vaclav ?Pavlik, Josef Peca, Antonin Pelc, Jaroslava Pesicova, Radomil Pilar, Bedrich Piskac, Theodor Pistek, Emil ?Artur Pittermann-Longen, Vilem Plocek, Stanislav Podhrazsky, Jaroslav Pokorny, Vaclac Pokorny, etc etc; creases and wear to paper dustjacket ; scarce ; FAIR. Book.…

Hardcover. Condition: Very Good. Dust Jacket Condition: Very Good. 1st Edition. 4° -322pp - B/w Reproductions (Photos, drawings, plans.) Czechoslovakian Architecture fifth year 1946. Text in Czech language and Summary and captions in Russian, English and French language. The issue N° 1-2-3 K. Roskot - Dusan Jurkovic - Arch. Prof. Josef Gocar "The Architectural Forum" - N° 4 "Lidice Shall Live"N° 5 Some of the architectonic works from the time of the German occupation" - N° 6 The Block of the progressive architective associations received in audience by the President of the Republic - N° 7 "The contest of the Stalin Works" - N° 8 "Interior work from the time of the occupation." - N°. 9 "The Reconstruction" - No. 10 devoted to the honour of the killed architects. Original boards. In Very good condition.…

Halbleinen. Condition: Gut. 197 S. Kreislauftheorie Wirtschaftskreislauf Bleistiftunterstreichungen und -anmerkungen. Guter Zustand Bibl-Ex. Mit Abb. Einband mit leichten Gebrauchsspuren. ha1079041 Sprache: Deutsch Gewicht in Gramm: 510.

Hardcover. Condition: Gut. 199 S. Kreislauftheorie Wirtschaftskreislauf Sehr guter Zustand Bibl-Ex. , Bibliothekseinband ha1079055 Sprache: Deutsch Gewicht in Gramm: 510.

PAP. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.

PAP. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.

Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other.…

Condition: New. Print on Demand pp. 428 241 Illus.