High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures - Softcover

Pietsch, Ullrich; Holy, Vaclav; Baumbach, Tilo

 
9781475740516: High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures

Synopsis

1 Elements for Designing an X-Ray Diffraction Experiment.- 2 Diffractometers and Reflectometers.- 3 Scans and Resolution in Angular and Reciprocal Space.- 4 Basic Principles.- 5 Kinematical Theory.- 6 Dynamical Theory.- 7 Semikinematical Theory.- 8 Determination of Layer Thicknesses of Single Layers and Multilayers.- 9 Lattice Parameters and Strains in Epitaxial Layers and Multilayers.- 10 Diffuse Scattering From Volume Defects in Thin Layers.- 11 X-Ray Scattering by Rough Multilayers.- 12 X-Ray Scattering by Artificially Lateral Semiconductor Nanostructures.- 13 Strain Analysis in Periodic Nanostructures.- 14 X-Ray Scattering from Self-Organized Structures.- References.

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Other Popular Editions of the Same Title

9780387400921: High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics)

Featured Edition

ISBN 10:  0387400923 ISBN 13:  9780387400921
Publisher: Springer, 2004
Hardcover